A rational theory of oblique incidence and its extension to stress-separation in birefringent composites

1983 ◽  
Vol 23 (1) ◽  
pp. 36-41 ◽  
Author(s):  
Shive K. Chaturvedi
Keyword(s):  
Oblique Incidence ◽  
Rational Theory ◽  
Stress Separation

Complete Two-Dimensional Principal Stress Separation by the Photoelastic Oblique Incidence Method

2006 ◽  
Vol 3-4 ◽  
pp. 229-234 ◽  
Author(s):  
Mark N. Pacey ◽  
Rachel A Tomlinson
Keyword(s):  
Principal Stress ◽  
Oblique Incidence ◽  
Normal Incidence ◽  
New Method ◽  
Two Dimensional ◽  
Principal Stresses ◽  
Isochromatic Fringe ◽  
Stress Separation

The oblique incidence method of photoelastic principal stress separation is reconsidered and presented in a form that allows the existence of negative fringe orders to be identified. The normal incidence isoclinic angle, two oblique incidence isoclinic angles and two oblique incidence isochromatic fringe orders are required for the new method. However, by allowing negative fringe orders to be identified, significant uncertainty relating to the separated principal stresses is removed and confidence in the calculated results may be improved

Oblique incidence observations as an aid to three-dimensional stress separation

1966 ◽  
Vol 1 (4) ◽  
pp. 322-330 ◽  
Author(s):  
I M Allison
Keyword(s):  
Stress Distribution ◽  
Oblique Incidence ◽  
Three Dimensional ◽  
Optical Measurements ◽  
Complete Analysis ◽  
Stress Separation ◽  
Alternative Method ◽  
Photoelastic Model ◽  
Plate Girder

In the most general case the determination of the separate stresses along a selected line in a three-dimensional photoelastic model requires the evaluation of the shear slopes in two mutually perpendicular planes which intersect in the chosen line. The measurement of one normal and two oblique observations at a series of corresponding points in a set of parallel slices provides an alternative method for determining the shear slopes and yields a complete analysis of the stress distribution without further optical measurements. The method is illustrated by its use to analyse the stresses in a model of a loaded rail supported upon a deep welded plate girder.

Scattering Rings in Birefringent Porous Silicon

2003 ◽  
Vol 762 ◽  
Author(s):  
Claudio J. Oton ◽  
Zeno Gaburro ◽  
Mher Ghulinyan ◽  
Nicola Daldosso ◽  
Lucio Pancheri ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Light Scattering ◽  
Porous Silicon ◽  
Direct Measurement ◽  
Optical Anisotropy ◽  
Oblique Incidence ◽  
Laser Light ◽  
Anisotropic Scattering ◽  
Scattering Measurements

AbstractWe report the observation of strongly anisotropic scattering of laser light at oblique incidence on (100)-oriented porous silicon layers. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the observation of the angle aperture of these rings allows a direct measurement of relative birefringence. We finally study the changes of optical anisotropy after different modifications of the structure.

Pb Electrodeposition in the Presence of Chlorine Ions on Cu(100): An in Situ Optical Reflectivity Difference Study

2003 ◽  
Vol 781 ◽  
Author(s):  
J. Gray ◽  
W. Schwarzacher ◽  
X.D. Zhu
Keyword(s):  
Oblique Incidence ◽  
Opposite Sign ◽  
Bulk Phase ◽  
Phase Layer ◽  
Optical Reflectivity ◽  
Scan Rate ◽  
Different Types ◽  
Chlorine Ions ◽  
High Overpotentials

AbstractWe studied the initial stages of the electrodeposition of Pb in the presence of chlorine ions on Cu(100), using an oblique-incidence optical reflectivity difference (OIRD) technique. The OI-RD results reveal that immediately following the underpotential deposition (UPD) of the first Pb monolayer, two different types of bulk-phase films grow depending upon the magnitude of overpotential and cyclic voltammetry (CV) scan rate. At low overpotentials and/or slow scan rates, we propose that a bulk-phase Pb film grows on top of the UPD monolayer. At high overpotentials and/or fast scan rates, either a PbO, PbCl2, or a rough Pb bulk-phase layer grows on top of the UPD layer such that the reflectivity difference signal from such a film has an opposite sign.

Calculation of the Ion Optical Properties of Inhomogeneous Magnetic Sector Fields Part 3: Oblique Incidence and Exit at Curved Boundaries

1959 ◽  
Vol 14 (9) ◽  
pp. 822-827 ◽  
Author(s):  
H. A. Tasman ◽  
A. J. H. Boerboom ◽  
H. Wachsmuth
Keyword(s):  
Oblique Incidence ◽  
Normal Incidence ◽  
Second Order ◽  
Resolving Power ◽  
High Mass ◽  
Curved Boundaries ◽  
Magnetic Sector ◽  
Mass Resolving Power ◽  
Mass Dispersion ◽  
Fringing Fields

In previous papers 1.2we presented the radial second order imaging properties of inhomogeneous magnetic sector fields with normal incidence and exit at plane boundaries. These fields may provide very high mass resolving power and mass dispersion without increase in radius or decrease of slit widths. In the present paper the calculations are extended to include the effect of oblique incidence and exit at curved boundaries. The influence of the fringing fields on axial focusing when the boundaries are oblique, is accounted for. It is shown that the second order angular aberration may Le eliminated by appropriate curvature of the boundaries.

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