Strain measurement by the reflection-moiré method

1971 ◽  
Vol 11 (2) ◽  
pp. 86-86 ◽  
Author(s):  
M. S. Gregory ◽  
A. W. Christian ◽  
I. F. Jones
Keyword(s):  
Strain Measurement ◽  
Moire Method ◽  
Reflection Moiré

An investigation of photoresists for use in optical strain analysis

1970 ◽  
Vol 5 (3) ◽  
pp. 162-168 ◽  
Author(s):  
A Luxmoore ◽  
R Hermann
Keyword(s):  
Strain Measurement ◽  
Strain Analysis ◽  
Surface Strain ◽  
High Contrast ◽  
Moire Method ◽  
Optical Strain

Some commercial photoresists have been examined to assess their suitability for use with the moiré method of surface-strain measurement. As most of these materials do not produce a pattern of high contrast directly, some etching and plating procedures are also described. Combined with correct illumination, these processes will produce grids of sufficient contrast for most applications.

scholarly journals Strain Measurement by Scanning-moire Method

1984 ◽  
Vol 27 (233) ◽  
pp. 2347-2352 ◽  
Author(s):  
Yoshiharu MORIMOTO ◽  
Takuo HAYASHI ◽  
Noriyuki YAMAGUCHI
Keyword(s):  
Strain Measurement ◽  
Moire Method

Displacement and Strain Measurement by Circular and Radial Gratings Moiré Method

2009 ◽  
Vol 50 (2) ◽  
pp. 239-244 ◽  
Author(s):  
X. Xiao ◽  
Y. Kang ◽  
Z. Hou ◽  
W. Qiu ◽  
X. Li ◽  
...  
Keyword(s):  
Strain Measurement ◽  
Moire Method

Strain Measurement in Resin-Molded IC Chips Using Sampling Moiré Method

2017 ◽  
Vol 2017 (0) ◽  
pp. J0330302
Author(s):  
Masaaki KOGANEMARU ◽  
Koki MATSUMOTO ◽  
Masakazu UCHINO ◽  
Toru IKEDA
Keyword(s):  
Strain Measurement ◽  
Moire Method

Warpage of thin wafers using computer aided reflection moire method

2007 ◽  
Author(s):  
Chi Seng Ng ◽  
Kok Yau Chua ◽  
Meng Tong Ong ◽  
Yoke Chin Goh ◽  
Anand K. Asundi
Keyword(s):  
Computer Aided ◽  
Moire Method ◽  
Reflection Moiré

Development of dynamic shape and strain measurement system by sampling moiré method

2009 ◽  
Author(s):  
Kosuke Shimo ◽  
Motoharu Fujigaki ◽  
Akihiro Masaya ◽  
Yoshiharu Morimoto
Keyword(s):  
Measurement System ◽  
Strain Measurement ◽  
Moire Method ◽  
Dynamic Shape

General interpretation of moiré patterns in strain analysis

1968 ◽  
Vol 3 (2) ◽  
pp. 90-95 ◽  
Author(s):  
B Košťáuk
Keyword(s):  
Physical Meaning ◽  
Strain Measurement ◽  
Strain Analysis ◽  
Theoretical Treatment ◽  
Two Dimensional ◽  
Contour Lines ◽  
Moire Patterns ◽  
Moire Method ◽  
System Properties ◽  
Moiré Patterns

A simple theoretical treatment of moiré patterns is given with the use of relations between diagonal systems that have the physical meaning of contour lines of the functions in question. The general approach and knowledge of diagonal-system properties can simplify various problems of strain measurement by the moiré method, and this is demonstrated by the compensation of a moiré pattern and by the method of two-dimensional strain measurement.

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