Recombination of electrons with highly charged heavy ions at very low energies

1996 ◽  
Vol 99 (1) ◽  
pp. 295-300 ◽  
Author(s):  
O. Uwira ◽  
A. Müller ◽  
W. Spies ◽  
J. Linkemann ◽  
A. Frank ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Low Energies

scholarly journals A study of directional effect of depth-concentration distribution for implanted heavy ions with low energies in dry peanut seeds

2003 ◽  
Vol 52 (10) ◽  
pp. 2530
Author(s):  
Xie Jing-Yi ◽  
Zhou Hong-Yu ◽  
Wang Ping ◽  
Ding Xiao-Ji ◽  
Liu Zhi-Guo ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Concentration Distribution ◽  
Directional Effect ◽  
Low Energies ◽  
Depth Concentration

Systematics of nucleon transfer between heavy ions at low energies

1971 ◽  
Vol 176 (2) ◽  
pp. 299-320 ◽  
Author(s):  
P.J.A. Buttle ◽  
L.J.B. Goldfarb
Keyword(s):  
Heavy Ions ◽  
Nucleon Transfer ◽  
Low Energies

On Doppler-Shift Attenuation Measurements

1972 ◽  
Vol 50 (24) ◽  
pp. 3147-3151 ◽  
Author(s):  
K. B. Winterbon
Keyword(s):  
Cross Section ◽  
Doppler Shift ◽  
Heavy Ions ◽  
Mass Ratio ◽  
Slowing Down ◽  
Target Mass ◽  
Doppler Shift Attenuation ◽  
Low Energies ◽  
Effet Doppler ◽  
The Mean

An improved analysis of Doppler-shifted γ spectra is outlined. This analysis is exact within the Lindhard theory of slowing down of heavy ions in solids.With an approximate cross section applicable at low energies, the equations become independent of the energy, except as a scaling parameter, and depend only on the projectile–target mass ratio. A set of universal curves of the mean fractional shift F(τ) is calculated in this approximation for several values of the mass ratio.Une analyse améliorée de spectres γ déplacés par effet Doppler est esquissée. Cette analyse est conforme à la théorie de Lindhard sur le ralentissement des ions lourds dans les solides.

scholarly journals Calculated Electronic Energy Loss of Heavy Ions at Low Energies in LR-115, Kapton, SiO2, and Al2O3 Amorphous Materials

2021 ◽  
Vol 47 (1) ◽  
pp. 17
Author(s):  
J. El Asri ◽  
O. El Bounagui ◽  
N. Tahiri ◽  
A. Chetaine ◽  
H. Erramli
Keyword(s):  
Energy Loss ◽  
Heavy Ions ◽  
Amorphous Materials ◽  
Electronic Energy ◽  
Low Energies

scholarly journals Analysis of Angular Distributions of Heavy-ion Transfer Reactions

1980 ◽  
Vol 33 (6) ◽  
pp. 965
Author(s):  
CBO Mohr
Keyword(s):  
Elastic Scattering ◽  
Heavy Ions ◽  
Heavy Ion ◽  
Critical Value ◽  
Transfer Reactions ◽  
Angular Distributions ◽  
Ion Transfer ◽  
S Matrix ◽  
Low Energies ◽  
Nuclear Phases

Proceeding as in our earlier analysis of elastic scattering, but with a form for the S matrix appropriate for transfer, peaked at the critical value Ie and with width parameter .d, it is shown how to analyse the angular distribution of transfer reactions of heavy ions to obtain.d. The effect of the nuclear phases is found not to be of such fundamental importance as in elastic scattering. Analysis of theexperimental data reveals an increase of.d with nuclear size especially at low energies, but an increase of nuclear penetration for transfer collisions of the lightest nuclei. The circumstances in which strong coupling might occur between elastic scattering and transfer are examined.

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

Fresnel interference in point-projection imaging of purple membrane

1995 ◽  
Vol 53 ◽  
pp. 846-847
Author(s):  
X. Zhang ◽  
J. Spence ◽  
W. Qian ◽  
D. Taylor ◽  
K. Taylor
Keyword(s):  
Detection Efficiency ◽  
Mean Free Path ◽  
Purple Membrane ◽  
Unit Cell Dimension ◽  
Experimental Point ◽  
Membrane Thickness ◽  
Low Energies ◽  
Channel Plate ◽  
Point Projection ◽  
Inelastic Mean Free Path

Experimental point-projection shadow microscope (PPM) images of uncoated, unstained purple membrane (PM, bacteriorhodopsin, a membrane protein from Halobacterium holobium) were obtained recently using 100 volt electrons. The membrane thickness is about 5 nm and the hexagonal unit cell dimension 6 nm. The images show contrast around the edges of small holes, as shown in figure 1. The interior of the film is opaque. Since the inelastic mean free path for 100V electrons in carbon (about 6 Å) is much less than the sample thickness, the question arises that how much, if any, transmission of elastically scattered electrons occurs. A large inelastic contribution is also expected, attenuated by the reduced detection efficiency of the channel plate at low energies. Quantitative experiments using an energy-loss spectrometer are planned. Recently Shedd has shown that at about 100V contrast in PPM images of thin gold films can be explained as Fresnel interference effects between different pinholes in the film, separated by less than the coherence width.

Sign in / Sign up

Export Citation Format

Share Document