Second-order bragg interaction in double grating couplers: TM mode

1994 ◽  
Vol 15 (11) ◽  
pp. 1923-1936
Author(s):  
Masoud Kasraian
Keyword(s):  
Second Order ◽  
Grating Couplers ◽  
Tm Mode

Cost-effective single-etched TM-mode SOI grating couplers for broadband perfectly vertical coupling

2014 ◽  
Author(s):  
G. Dabos ◽  
D. Kalavrouziotis ◽  
J. Bolten ◽  
A. Prinzen ◽  
N. Pleros ◽  
...  
Keyword(s):  
Cost Effective ◽  
Grating Couplers ◽  
Vertical Coupling ◽  
Tm Mode

Design of second order grating couplers to detect the angle and polarization of the laser beam

2012 ◽  
Author(s):  
Tapas Kumar Saha ◽  
Mingyu Lu ◽  
Deyin Zhao ◽  
Zhenqiang Ma ◽  
Weidong Zhou
Keyword(s):  
Laser Beam ◽  
Second Order ◽  
Grating Couplers

Second order effects of aspect ratio variations in high sensitivity grating couplers

2007 ◽  
Vol 84 (5-8) ◽  
pp. 1775-1778 ◽  
Author(s):  
N. Darwish ◽  
L. Diéguez ◽  
M. Moreno ◽  
F. Muñoz ◽  
R. Mas ◽  
...  
Keyword(s):  
Aspect Ratio ◽  
High Sensitivity ◽  
Second Order ◽  
Order Effects ◽  
Grating Couplers ◽  
Second Order Effects

scholarly journals Low-temperature expansion of the Casimir–Polder free energy for an atom interacting with a conductive plane

2019 ◽  
Vol 34 (02) ◽  
pp. 1950008 ◽  
Author(s):  
N. Khusnutdinov ◽  
N. Emelianova
Keyword(s):  
Free Energy ◽  
Low Temperature ◽  
Second Order ◽  
Symmetric Form ◽  
Temperature Expansion ◽  
Tm Mode ◽  
Plane System

The low-temperature expansion of the free energy of an atom/plane system is considered for a general symmetric form of the tensor conductivity of the plane. It is shown that the first correction is proportional to the second order of the temperature [Formula: see text] and comes from the TM mode. The agreement of the expansion and exact expressions for different models of conductivity is numerically demonstrated.

scholarly journals Silicon nitride ring resonator biosensors operated at 1310 nm wavelengths via TM-mode grating couplers

2021 ◽  
Author(s):  
Lucía Castelló-Pedrero ◽  
María I. Gómez-Gómez ◽  
Jaime García-Rupérez ◽  
Amadeu Griol ◽  
Alejandro Martínez
Keyword(s):  
Silicon Nitride ◽  
Bovine Serum Albumin ◽  
Serum Albumin ◽  
Bovine Serum ◽  
Transverse Magnetic ◽  
Ring Resonators ◽  
Grating Couplers ◽  
Tm Mode ◽  
Highly Sensitive ◽  
Integrated Device

Abstract In this work, we demonstrate a full photonic integrated device for performing highly-sensitive biosensing using silicon nitride ring resonators propagating transverse-magnetic modes at wavelengths around 1310 nm. The device includes fully-etched grating couplers as interfaces with external optical fibres. Sensing experiments are performed in a microfluidic environment using bovine serum albumin and anti-bovine serum albumin as biological agents. In comparison with other photonic platforms based on ring resonators propagating transverse-electric modes, our device shows a better detection performance though the efficiency of the grating couplers can be further improved.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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