Depth profiling of wood preservatives with neutron activation and beta spectroscopy

1994 ◽  
Vol 180 (1) ◽  
pp. 115-119 ◽  
Author(s):  
G. Kennedy ◽  
N. Dai
Keyword(s):  
Neutron Activation ◽  
Depth Profiling ◽  
Wood Preservatives ◽  
Beta Spectroscopy

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Development of a Rapid Survey Method of Sampling and Analysis for Asbestos in Ambient Air

1972 ◽  
Vol 30 ◽  
pp. 630-631 ◽  
Author(s):  
R. E. Heffelfinger ◽  
C. W. Melton ◽  
D. L. Kiefer ◽  
W. M. Henry ◽  
R. J. Thompson
Keyword(s):  
Neutron Activation ◽  
Ambient Air ◽  
Survey Method ◽  
Potential Hazard ◽  
Transmission Microscopy ◽  
Comparative Analyses ◽  
Asbestos Fibers ◽  
Controlled Conditions ◽  
Unequivocal Identification ◽  
Identification And Quantification

A methodology has been developed and demonstrated which is capable of determining total amounts of asbestos fibers and fibrils in air ranging from as low as fractional nanograms per cubic meter (ng/m3) of air to several micrograms/m3. The method involves the collection of samples on an absolute filter and provides an unequivocal identification and quantification of the total asbestos contents including fibrils in the collected samples.The developed method depends on the trituration under controlled conditions to reduce the fibers to fibrils, separation of the asbestos fibrils from other collected air particulates (beneficiation), and the use of transmission microscopy for identification and quantification. Its validity has been tested by comparative analyses by neutron activation techniques. It can supply the data needed to set emissions criteria and to serve as a basis for assessing the potential hazard for asbestos pollution to the populace.

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

Gamma-Ray Spectrometric Analysis of Some Trace Elements in the Human Articular Disc of the Mandible

1963 ◽  
Vol 03 (02) ◽  
pp. 175-182 ◽  
Author(s):  
Bo Bergman ◽  
Rune Söremark
Keyword(s):  
Trace Elements ◽  
Neutron Activation ◽  
Quantitative Data ◽  
Thermal Neutron Flux ◽  
Gamma Ray ◽  
Dry Weight ◽  
Gamma Ray Spectrometry ◽  
Spectrometric Analysis ◽  
Articular Disc ◽  
Group Separation

SummaryBy means of neutron activation and gamma-ray spectrometry the concentrations in the human mandibular articular disc of the following elements have been determined: Na, Mn, Cu, Zn, Rb, Sr, Cd, W, and Au. The discs were obtained at necropsy from seven men and nine women, ranging in age from 56 to 71 years.The activation was carried out in a thermal neutron flux of about 1.7 XlO12 neutrons × cm−2 × sec.−1 for about 20 hours. A chemical group separationwas performed before the gamma-ray spectrometry. Quantitative data based on the dry weight of the cartilage samples were obtained by comparing the photo-peak area of the identified elements with those of appropriate standards.

Tracing Estuarine Sediments by Neutron Activation

1977 ◽  
Author(s):  
Richard M. Ecker ◽  
John F. Sustar ◽  
William T. Harvey
Keyword(s):  
Neutron Activation ◽  
Estuarine Sediments

Evaluation of the uncertainty associated with sample holders in NAA measurements in LAN/IPEN

2019 ◽  
Vol 7 (2A) ◽  
Author(s):  
Guilherme Soares Zahn ◽  
Regina Beck Ticianelli ◽  
Mitiko Saiki ◽  
Frederico Antonio Genezini
Keyword(s):  
Stainless Steel ◽  
Neutron Activation Analysis ◽  
Neutron Activation ◽  
Gamma Rays ◽  
Experimental Error ◽  
Steel Sample ◽  
Low Energy ◽  
Stainless Steel Sample ◽  
Gamma Emission ◽  
Energy Gamma

In IPEN’s Neutron Activation Laboratory (LAN/IPEN), thin stainless steel sample holders are used for gamma spectrometry in NAA measurements. This material is very practical, but its chemical composition may be troublesome, as it presents large amounts of elements with intermediate atomic number, with attenuation factors for low-energy gamma-rays that must not be neglected. In this study, count rates obtained using different sample holders were compared. To accomplish that, an Am-241 source, with 59-keV gamma emission, was used so that low-energy gamma attenuation differences can be determined. Moreover, in order to study the energy dependence of these differences, a Ho-166m source was also used. From these results, it was possible to analyze the experimental error associated to the variations between sample holders, with the aim of introducing an addictive term to the uncertainty analysis of comparative Neutron Activation Analysis results.

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