Schlieren method with narrow screen for electron density determination in a plasma

1985 ◽  
Vol 35 (2) ◽  
pp. 155-157 ◽  
Author(s):  
P. Kubeš ◽  
J. Kravárik ◽  
J. Bacílek ◽  
J. Hruška ◽  
V. Kraváriková ◽  
...  
1982 ◽  
Vol 13 (4) ◽  
Author(s):  
D. A. CLEMENTE ◽  
B. REES ◽  
G. BANDOLI ◽  
M. CINGI BIAGINI ◽  
B. REITER ◽  
...  

1975 ◽  
Vol 30 (12) ◽  
pp. 1560-1562
Author(s):  
M. Brünger ◽  
M. Kock

Abstract By means of a 2 λ-Michelson-Interferometer the electron density has been determined with a mean accuracy of 2% in the axis of a wall-stabilized arc which has been operated in Argon at atmospheric pressure in a range from 10 to 100 A. The measurements have been performed with He-Ne-lasers at wavelengths λ1=0.63 μ and λ2 = 1.15 μ.


2019 ◽  
Vol 75 (4) ◽  
pp. 600-609 ◽  
Author(s):  
Bjarke Svane ◽  
Kasper Tolborg ◽  
Lasse Rabøl Jørgensen ◽  
Martin Roelsgaard ◽  
Mads Ry Vogel Jørgensen ◽  
...  

Electron density determination based on structure factors obtained through powder X-ray diffraction has so far been limited to high-symmetry inorganic solids. This limit is challenged by determining high-quality structure factors for crystalline urea using a bespoke vacuum diffractometer with imaging plates. This allows the collection of data of sufficient quality to model the electron density of a molecular system using the multipole method. The structure factors, refined parameters as well as chemical bonding features are compared with results from the high-quality synchrotron single-crystal study by Birkedalet al.[Acta Cryst.(2004), A60, 371–381] demonstrating that powder X-ray diffraction potentially provides a viable alternative for electron density determination in simple molecular crystals where high-quality single crystals are not available.


1994 ◽  
Vol 75 (3) ◽  
pp. 1846-1848 ◽  
Author(s):  
V. Rousseau ◽  
C. Boisse‐Laporte ◽  
Ph. Leprince ◽  
J. Marec

2018 ◽  
Vol 127 ◽  
pp. S1183-S1184
Author(s):  
L. Schröder ◽  
U. Stanković ◽  
M.F. Fast ◽  
J.J. Sonke

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