Studies of the fine structure of absorption edges in the soft x-ray region are becoming increasingly important as a tool for materials characterization. Examples of application includes determination of chemical state of elements, bonding and band structure studies. Intensity and resolving power of the x-ray spectrometer are important experimental considerations. As a rule adjustment of instrumental parameters, such as collimation, to give increased intensity adversely affect resolving power. Optimization of intensity and resolving power must therefore he achieved.A newly designed double crystal spectrometer has been constructed for high-resolution absorption edge studies in the wavelength region of 5Ǻ to 70Ǻ.The entire system is enclosed in a vacuum chamber ion pumped to the 10-7 torr range. The second crystal motion is obtained by means of an ULTRADEX 360-sided polygon and sine arm that is automatically step-scanned. The spectrometer functions equally well in the (l, + l) and (l, - l) orientation and as a precise single crystal spectrometer.
New methods of X-ray spectroscopy of laser-produced plasmas with one-dimensional spatial resolution