The effect of mechanical clamping on dielectric properties of deuterated Rochelle salt

1973 ◽  
Vol 23 (4) ◽  
pp. 495-498 ◽  
Author(s):  
G. G. Kessenikh ◽  
J. Štrajblová ◽  
L. A. Shuvalov ◽  
J. Janta
Keyword(s):  
Dielectric Properties ◽  
Rochelle Salt

Dielectric properties of compressed Rochelle-salt powders

1974 ◽  
Vol 21 (2) ◽  
pp. 725-731 ◽  
Author(s):  
A. Mansingh ◽  
S. S. Bawa
Keyword(s):  
Dielectric Properties ◽  
Rochelle Salt

Dielectric properties of deuterated ammonium Rochelle salt

1984 ◽  
Vol 51 (10) ◽  
pp. 809-810 ◽  
Author(s):  
C. Filipič ◽  
R. Blinc ◽  
A. Levstik
Keyword(s):  
Dielectric Properties ◽  
Rochelle Salt

Dielectric properties of porous aluminum oxide with inclusions of triglycine sulphate and Rochelle salt

2010 ◽  
Vol 74 (9) ◽  
pp. 1291-1294 ◽  
Author(s):  
O. M. Golitsyna ◽  
S. N. Drozhdin ◽  
A. E. Gridnev ◽  
V. V. Chernyshev ◽  
I. E. Zanin
Keyword(s):  
Dielectric Properties ◽  
Aluminum Oxide ◽  
Rochelle Salt ◽  
Triglycine Sulphate ◽  
Porous Aluminum ◽  
Porous Aluminum Oxide

Low-Frequency Dielectric Properties of the Rochelle Salt and its Deuterated Analogue

2002 ◽  
Vol 268 (1) ◽  
pp. 41-46 ◽  
Author(s):  
Inna A. Malyshkina ◽  
Nadezhda D. Gavrilova
Keyword(s):  
Dielectric Properties ◽  
Low Frequency ◽  
Rochelle Salt ◽  
Deuterated Analogue

scholarly journals Einfluß von Gitterfehlern auf die dielektrischen Eigenschaften von Seignettesalz

1968 ◽  
Vol 23 (7) ◽  
pp. 997-1000 ◽  
Author(s):  
Erich W. Labouvie
Keyword(s):  
Dielectric Constant ◽  
Crystal Growth ◽  
Dielectric Properties ◽  
Curie Point ◽  
Crystal Defects ◽  
Rochelle Salt ◽  
Etching Method ◽  
Salt Crystals ◽  
Made In

It is shown by an etching method joined with microscopical observations that the structure of Rochelle salt crystals is not very much disturbed by dislocations and sudares. The correlation between the distributions of dislocations and sudares is obviously determined by the process of crystal growth. Measurements of the upper Curie-point and the dielectric constant are made in order to reveal some influence of these crystal defects on the dielectric properties.

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