Identification of trace impurities in pure and doped YAlO3 and Y3Al5O12 crystals by their fluorescence and by the EMA method

1993 ◽  
Vol 43 (6) ◽  
pp. 683-696 ◽  
Author(s):  
J. A. Mareš ◽  
J. Chval ◽  
M. Nikl ◽  
G. Boulon
Keyword(s):  
Trace Impurities ◽  
Ema Method

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

Investigating the Dynamics of Suicidal Ideation

Crisis ◽  
2018 ◽  
Vol 39 (1) ◽  
pp. 65-69 ◽  
Author(s):  
Nina Hallensleben ◽  
Lena Spangenberg ◽  
Thomas Forkmann ◽  
Dajana Rath ◽  
Ulrich Hegerl ◽  
...  
Keyword(s):  
Suicidal Ideation ◽  
Small Sample Size ◽  
Unipolar Depression ◽  
Small Sample ◽  
History Of ◽  
Severity Of Depression ◽  
Ecological Momentary ◽  
Depressive Episodes ◽  
Ema Method ◽  
Shed Light

Abstract. Background: Although the fluctuating nature of suicidal ideation (SI) has been described previously, longitudinal studies investigating the dynamics of SI are scarce. Aim: To demonstrate the fluctuation of SI across 6 days and up to 60 measurement points using smartphone-based ecological momentary assessments (EMA). Method: Twenty inpatients with unipolar depression and current and/or lifetime suicidal ideation rated their momentary SI 10 times per day over a 6-day period. Mean squared successive difference (MSSD) was calculated as a measure of variability. Correlations of MSSD with severity of depression, number of previous depressive episodes, and history of suicidal behavior were examined. Results: Individual trajectories of SI are shown to illustrate fluctuation. MSSD values ranged from 0.2 to 21.7. No significant correlations of MSSD with several clinical parameters were found, but there are hints of associations between fluctuation of SI and severity of depression and suicidality. Limitations: Main limitation of this study is the small sample size leading to low power and probably missing potential effects. Further research with larger samples is necessary to shed light on the dynamics of SI. Conclusion: The results illustrate the dynamic nature and the diversity of trajectories of SI across 6 days in psychiatric inpatients with unipolar depression. Prediction of the fluctuation of SI might be of high clinical relevance. Further research using EMA and sophisticated analyses with larger samples is necessary to shed light on the dynamics of SI.

scholarly journals Development of decomposition techniques for the determination of trace impurities in high-purity ruthenium metal.

1999 ◽  
Vol 48 (9) ◽  
pp. 835-840 ◽  
Author(s):  
Masamitsu FUKUDA ◽  
Kazutoshi SHIMURA ◽  
Minoru TAKEYA
Keyword(s):  
High Purity ◽  
Decomposition Techniques ◽  
Trace Impurities

scholarly journals Effect of Trace Impurities in Pure Water on Corrosion of Carbon Steel at Room Temperature

1984 ◽  
Vol 33 (12) ◽  
pp. 689-693
Author(s):  
Takashi Honda ◽  
Eiji Kashimura ◽  
Akira Minato
Keyword(s):  
Carbon Steel ◽  
Room Temperature ◽  
Pure Water ◽  
Trace Impurities

Stable-Form Screening: Overcoming Trace Impurities That Inhibit Solution-Mediated Phase Transformation to the Stable Polymorph of Sulfamerazine

2008 ◽  
Vol 97 (6) ◽  
pp. 2130-2144 ◽  
Author(s):  
Yuchuan Gong ◽  
Benjamin M. Collman ◽  
Shawn M. Mehrens ◽  
Enxian Lu ◽  
Jonathan M. Miller ◽  
...  
Keyword(s):  
Phase Transformation ◽  
Stable Form ◽  
Trace Impurities ◽  
Stable Polymorph
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