Lifetime measurements and stark mixing of autoionizing Cu I-states

1988 ◽  
Vol 10 (4) ◽  
pp. 445-449 ◽  
Author(s):  
S. Baier ◽  
M. Martins ◽  
B. R. M�ller ◽  
P. Zimmermann
Keyword(s):  
Lifetime Measurements ◽  
Stark Mixing

Angular correlation and lifetime measurements in Ne

1968 ◽  
Vol 111 (1) ◽  
pp. 529-550
Author(s):  
W KUTSCHERA ◽  
D PELTE ◽  
G SCHRIEDER
Keyword(s):  
Angular Correlation ◽  
Lifetime Measurements

DELAYED COINCIDENCE AUGER ELECTRON LIFETIME MEASUREMENTS

1979 ◽  
Vol 40 (C1) ◽  
pp. C1-221-C1-222
Author(s):  
S. Schumann ◽  
I. A. Sellin ◽  
R. Mann ◽  
H. J. Frischkorn ◽  
D. Rosich ◽  
...  
Keyword(s):  
Auger Electron ◽  
Electron Lifetime ◽  
Lifetime Measurements

Seeking the Good Fitting Procedure of PALS Polymer Spectra

2008 ◽  
Vol 607 ◽  
pp. 64-66
Author(s):  
Nicolas Laforest ◽  
Jérémie De Baerdemaeker ◽  
Corine Bas ◽  
Charles Dauwe
Keyword(s):  
Experimental Data ◽  
Low Temperature ◽  
Positron Annihilation ◽  
Physical Meaning ◽  
Lifetime Measurements ◽  
Positron Annihilation Lifetime ◽  
Fitting Procedure ◽  
Fitting Procedures ◽  
Blob Model

Positron annihilation lifetime measurements on polymethylmethacrylate (PMMA) at low temperature were performed. Different discrete fitting procedures have been used to analyze the experimental data. It shows that the extracted parameters depend strongly on the fitting procedure. The physical meaning of the results is discussed. The blob model seems to give the best annihilation parameters.

Collective properties of neutron-deficient Nd isotopes: Lifetime measurements of the yrast states in Nd136

2021 ◽  
Vol 103 (4) ◽  
Author(s):  
A. Turturică ◽  
C. Costache ◽  
P. Petkov ◽  
J.-P. Delaroche ◽  
M. Girod ◽  
...  
Keyword(s):  
Nd Isotopes ◽  
Lifetime Measurements

scholarly journals Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements

2021 ◽  
Vol 118 (25) ◽  
pp. 252105
Author(s):  
K. Yokoyama ◽  
J. S. Lord ◽  
J. Miao ◽  
P. Murahari ◽  
A. J. Drew
Keyword(s):  
Carrier Lifetime ◽  
Surface Recombination ◽  
Lifetime Measurements

scholarly journals Reaching the Planck scale with muon lifetime measurements

2021 ◽  
Vol 103 (10) ◽  
Author(s):  
Iarley P. Lobo ◽  
Christian Pfeifer
Keyword(s):  
Planck Scale ◽  
Lifetime Measurements ◽  
Muon Lifetime

Microscopic FCA System for Depth-Resolved Carrier Lifetime Measurement in SiC

2018 ◽  
Vol 924 ◽  
pp. 269-272 ◽  
Author(s):  
Shinichi Mae ◽  
Takeshi Tawara ◽  
Hidekazu Tsuchida ◽  
Masashi Kato
Keyword(s):  
Carrier Lifetime ◽  
Laser Light ◽  
Probe Laser ◽  
Free Carrier Absorption ◽  
Cross Sectional ◽  
Lifetime Measurements ◽  
Control Distribution ◽  
System A ◽  
Excitation Laser ◽  
Carrier Absorption

For high voltage SiC bipolar devices, carrier lifetime is an important parameter, and for optimization of device performance, we need to control distribution of the carrier lifetime in a wafer. So far, there have been limited systems for depth-resolved carrier lifetime measurements without cross sectional cut. In this study, we adopted a free carrier absorption technique and made local overlapping of the probe laser light with excitation laser light to develop depth-resolved carrier lifetime measurements. We named the developed system a microscopic FCA system and demonstrated measurement results for samples with and without intentional carrier lifetime distribution.

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