A 3-D vision system model for automatic object surface sensing

1993 ◽  
Vol 11 (1) ◽  
pp. 75-99 ◽  
Author(s):  
Vassilios E. Theodoracatos ◽  
Dale E. Calkins
Author(s):  
Vassilios E. Theodoracatos ◽  
Dale E. Calkins

Abstract The development of a “light striping” (structured light) based three-dimensional vision system for automatic surface sensing is presented. The three-dimensional world-point reconstruction process and system modeling methodology involves homogeneous coordinate transformations applied in two independent stages; the video imaging stage using three-dimensional perspective transformations, and the mechanical scanning stage, using three-dimensional affine transformations. Concatenation of the two independent matrix models leads to a robust four-by-four matrix system model. The independent treatment of the two-dimensional imaging process from the three-dimensional modeling process, has reduced the number of unknown internal and external geometrical parameters. The reconstructed sectional contours (light stripes) are automatically and in real-time registered with respect to a common world coordinate system in a format compatible with B-spline surface approximation. The reconstruction process is demonstrated by measuring the surface of a 19.5-ft long by 2 feet beam rowing shell. A detailed statistical accuracy and precision analysis shows an average error, 0.2 percent (0.002), of an object’s largest dimension within the the camera’s field-of-view. System sensitivity analysis reveals a nonlinear increase for angles between the normals of the image and laser planes higher than 45 degrees.


2008 ◽  
Vol 22 (8) ◽  
pp. 867-892 ◽  
Author(s):  
Kitti Suwanratchatamanee ◽  
Mitsuharu Matsumoto ◽  
Shuji Hashimoto

Author(s):  
W. Engel ◽  
M. Kordesch ◽  
A. M. Bradshaw ◽  
E. Zeitler

Photoelectron microscopy is as old as electron microscopy itself. Electrons liberated from the object surface by photons are utilized to form an image that is a map of the object's emissivity. This physical property is a function of many parameters, some depending on the physical features of the objects and others on the conditions of the instrument rendering the image.The electron-optical situation is tricky, since the lateral resolution increases with the electric field strength at the object's surface. This, in turn, leads to small distances between the electrodes, restricting the photon flux that should be high for the sake of resolution.The electron-optical development came to fruition in the sixties. Figure 1a shows a typical photoelectron image of a polycrystalline tantalum sample irradiated by the UV light of a high-pressure mercury lamp.


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