Frictional and atomic-scale study of C60 thin films by scanning force microscopy

1994 ◽  
Vol 95 (1) ◽  
pp. 1-3 ◽  
Author(s):  
R. L�thi ◽  
H. Haefke ◽  
E. Meyer ◽  
L. Howald ◽  
H. -P. Lang ◽  
...  
2009 ◽  
Vol 94 (3) ◽  
pp. 032907 ◽  
Author(s):  
Yunseok Kim ◽  
Changdeuck Bae ◽  
Kyunghee Ryu ◽  
Hyoungsoo Ko ◽  
Yong Kwan Kim ◽  
...  

1998 ◽  
Vol 93 (2) ◽  
pp. 437-441
Author(s):  
M. Nowicki ◽  
A. Richter ◽  
R. Ries ◽  
M. Oszwałdowski

1996 ◽  
Author(s):  
G. Bar ◽  
S. Rubin ◽  
A.N. Parikh ◽  
B.I. Swanson ◽  
T.A. Zawodzinski

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