Current distribution on a three-dimensional, bond-diluted, random-resistor network at the percolation threshold

1990 ◽  
Vol 60 (3-4) ◽  
pp. 363-381 ◽  
Author(s):  
Edgardo Duering ◽  
David J. Bergman
Keyword(s):  
Percolation Threshold ◽  
Current Distribution ◽  
Three Dimensional ◽  
Random Resistor Network ◽  
Resistor Network

scholarly journals Resistance distributions of the random resistor network near the percolation threshold

1990 ◽  
Vol 41 (7) ◽  
pp. 4610-4618 ◽  
Author(s):  
A. B. Harris ◽  
Yigal Meir ◽  
Amnon Aharony
Keyword(s):  
Percolation Threshold ◽  
Random Resistor Network ◽  
Resistor Network

Minimum current in the two-component random resistor network

1992 ◽  
Vol 46 (19) ◽  
pp. 12137-12141 ◽  
Author(s):  
K. W. Yu ◽  
P. Y. Tong
Keyword(s):  
Random Resistor Network ◽  
Resistor Network ◽  
Two Component

Effect of three-dimensional current distribution on characterizing parasitic resistance of FinFETs

2016 ◽  
Vol 55 (4S) ◽  
pp. 04ED16 ◽  
Author(s):  
Fan-Hsuan Meng ◽  
Po-Yen Lin ◽  
Yu-Lun Chiu ◽  
Bo-Rong Huang ◽  
Chrong Jung Lin ◽  
...  
Keyword(s):  
Current Distribution ◽  
Three Dimensional ◽  
Parasitic Resistance

scholarly journals Electrical Double Percolation of Polybutadiene/Polyethylene Glycol Blends Loaded with Conducting Polymer Nanofibers

Polymers ◽  
2020 ◽  
Vol 12 (11) ◽  
pp. 2658
Author(s):  
Jun Morita ◽  
Takanori Goto ◽  
Shinji Kanehashi ◽  
Takeshi Shimomura
Keyword(s):  
Polyethylene Glycol ◽  
Critical Exponent ◽  
Percolation Threshold ◽  
Field Effect ◽  
Carrier Transport ◽  
Three Dimensional ◽  
Scanning Force Microscopy ◽  
Three Dimensions ◽  
Dimensional Variable ◽  
Double Percolation

The critical phenomena of double percolation on polybutadiene (PB)/polyethylene glycol (PEG) blends loaded with poly-3-hexylthiophene (P3HT) nanofibers is investigated. P3HT nanofibers are selectively localized in the PB phase of the PB/PEG blend, as observed by scanning force microscopy (SFM). Moreover, double percolation is observed, i.e., the percolation of the PB phase in PB/PEG blends and that of the P3HT nanofibers in the PB phase. The percolation threshold (φcI) and critical exponent (tI) of the percolation of the PB phase in PB/PEG blends are estimated to be 0.57 and 1.3, respectively, indicating that the percolation exhibits two-dimensional properties. For the percolation of P3HT nanofibers in the PB phase, the percolation threshold (φcII) and critical exponent (tII) are estimated to be 0.02 and 1.7, respectively. In this case, the percolation exhibits properties in between two and three dimensions. In addition, we investigated the dimensionality with respect to the carrier transport in the P3HT nanofiber network. From the temperature dependence of the field-effect mobility estimated by field-effect transistor (FET) measurements, the carrier transport was explained by a three-dimensional variable range hopping (VRH) model.

A Percolative Approach to Electromigration Modelling

2000 ◽  
Vol 612 ◽  
Author(s):  
C. Pennetta ◽  
L. Reggiani ◽  
Gy. Trefán ◽  
F. Fantini ◽  
A. Scorzoni ◽  
...  
Keyword(s):  
Stochastic Model ◽  
Normal Distribution ◽  
Early Stage ◽  
Random Resistor Network ◽  
Resistor Network ◽  
Metallic Interconnects ◽  
Compositional Effects ◽  
The Times ◽  
Log Normal ◽  
Log Normal Distribution

AbstractWe present a stochastic model which simulates electromigration damage in metallic interconnects by biased percolation of a random resistor network. The main features of experiments including Black's law and the log-normal distribution of the times to failure are well reproduced together with compositional effects showing up in early stage measurements made on Al-0.5%Cu and Al-1%Si lines.

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