Higher order approximation for local behaviour of two dimensional flows at the confluence of free streamlines and analytic solid boundaries

1989 ◽  
Vol 76 (3-4) ◽  
pp. 243-252 ◽  
Author(s):  
S. N. Hanna ◽  
M. B. Abd-el-Malek
1989 ◽  
Vol 58 (9) ◽  
pp. 3077-3080
Author(s):  
Michiaki Matsukawa ◽  
Shinsuke Watanabe ◽  
Hiroshi Tanaca

1989 ◽  
Vol 58 (9) ◽  
pp. 3081-3084
Author(s):  
Michiaki Matsukawa ◽  
Shinsuke Watanabe ◽  
Hiroshi Tanaca

Author(s):  
N. Chinone ◽  
Y. Cho ◽  
R. Kosugi ◽  
Y. Tanaka ◽  
S. Harada ◽  
...  

Abstract A new technique for local deep level transient spectroscopy (DLTS) imaging using super-higher-order scanning nonlinear dielectric microscopy is proposed. Using this technique. SiCVSiC structure samples with different post oxidation annealing conditions were measured. We observed that the local DLTS signal decreases with post oxidation annealing (POA), which agrees with the well-known phenomena that POA reduces trap density. Furthermore, obtained local DLTS images had dark and bright areas, which is considered to show the trap distribution at/near SiCVSiC interface.


2001 ◽  
Vol 13 (12) ◽  
pp. 3699-3708 ◽  
Author(s):  
P. W. C. Vosbeek ◽  
G. J. F. van Heijst ◽  
V. P. Mogendorff

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