Functional integration and variational equations of nonlinear optics

1994 ◽  
Vol 68 (2) ◽  
pp. 271-274
Author(s):  
V. S. Yarunin
Keyword(s):  
Nonlinear Optics ◽  
Functional Integration ◽  
Variational Equations

On the motion of comet P/d’Arrest

1974 ◽  
Vol 22 ◽  
pp. 145-148
Author(s):  
W. J. Klepczynski
Keyword(s):  
Equations Of Motion ◽  
Variational Equations ◽  
Partial Derivatives

AbstractThe differences between numerically approximated partial derivatives and partial derivatives obtained by integrating the variational equations are computed for Comet P/d’Arrest. The effect of errors in the IAU adopted system of masses, normally used in the integration of the equations of motion of comets of this type, is investigated. It is concluded that the resulting effects are negligible when compared with the observed discrepancies in the motion of this comet.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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