Background correction by wavelength modulation using a microcomputer in atomic emission spectrometry

1986 ◽  
Vol 89 (1-6) ◽  
pp. 357-367 ◽  
Author(s):  
Ali G�kmen ◽  
Mehrdad Delzendeh ◽  
M�rvet Volkan ◽  
O. Yavuz Ataman ◽  
John M. Ottaway
Keyword(s):  
Atomic Emission ◽  
Background Correction ◽  
Atomic Emission Spectrometry ◽  
Emission Spectrometry ◽  
Wavelength Modulation

Wavelength Modulation for Background Correction in Graphite Furnace Atomic Emission Spectrometry

1976 ◽  
Vol 30 (3) ◽  
pp. 324-329 ◽  
Author(s):  
M. S. Epstein ◽  
T. C. Rains ◽  
T. C. O'Haver
Keyword(s):  
Graphite Furnace ◽  
Growth Curves ◽  
Detection Limits ◽  
Atomic Emission ◽  
Background Correction ◽  
Atomic Emission Spectrometry ◽  
Emission Spectrometry ◽  
Wavelength Modulation ◽  
Sample Analysis ◽  
Molecular Absorption

The use of wavelength modulation for background correction in graphite furnace atomic emission spectrometry is shown to improve detection limits in some cases by several orders of magnitude and to increase its applicability to sample analysis. An HGA-2100 graphite furnace atomizer is used in conjunction with a 3/4-m monochromator equipped for wavelength modulation. A discussion of analytical growth curves, detection limits, scatter, and optimization of signal/noise ratio is presented. Copper is analyzed in botanical samples and the results are compared to analysis by atomic absorption and molecular absorption spectrophotometry.

Acousto-Optic Signal Modulation for Atomic Emission Spectrometry Background Correction

1997 ◽  
Vol 51 (6) ◽  
pp. 765-769 ◽  
Author(s):  
Thomas M. Spudich ◽  
Brian A. Pelz ◽  
Jon W. Carnahan
Keyword(s):  
Atomic Emission ◽  
Atomic Spectrometry ◽  
Background Correction ◽  
Atomic Emission Spectrometry ◽  
Emission Spectrometry ◽  
Signal Modulation ◽  
Spectral Shifting ◽  
On Line ◽  
Correction System

An acousto-optic diffraction device is mounted within a polychromator to perform spectral shifting for the purpose of background correction for atomic spectrometry. Controlling the applied frequency to the acousto-optic allows “on-line” and “off-line” spectral observations. Preliminary investigations included characterization of the behavior of the photomultiplier tube (PMT) signal output at various acoustic frequencies and applied powers to verify the applicability of the system. Low-rate (0.1 Hz) frequency modulation was performed to successfully test the applicability of the background-correction system.

scholarly journals Development and Application of Acousto-Optic Background Correction for Inductively Coupled Plasma Atomic Emission Spectrometry

2003 ◽  
Vol 57 (6) ◽  
pp. 703-710
Author(s):  
Heather M. Miller ◽  
Thomas M. Spudich ◽  
Jon W. Carnahan
Keyword(s):  
Inductively Coupled Plasma ◽  
Atomic Emission ◽  
Background Correction ◽  
Sample Introduction ◽  
Atomic Emission Spectrometry ◽  
Emission Spectrometry ◽  
Plasma Atomic Emission ◽  
Plasma Atomic Emission Spectrometry ◽  
Inductively Coupled ◽  
Flame Atomic Absorption

In two configurations, a solid-state acousto-optic (AO) deflector or modulator is mounted in a 0.5 m monochromator for background correction with inductively coupled plasma atomic emission spectrometry (ICP-AES). A fused silica acousto-optic modulator (AOM) is used in the ultraviolet (UV) spectral region applications while a glass AO deflector (AOD) is used for the visible (VIS) region. The system provides rapid sequential observation of adjacent on- and off-line wavelengths for background correction. Seventeen elements are examined using pneumatic nebulization (PN) and electrothermal vaporization (ETV) sample introduction. Calibration plots were obtained with each sample introduction technique. Potable water and vitamin tablets were analyzed. Flame atomic absorption (FAA) was used to verify the accuracy of the AO background correction system.

Dynamic Background Correction by Wavelength Modulation in ICP Atomic Emission Spectrometry (AES) and its Application to Flow-Injection-ICP-AES

1992 ◽  
Vol 46 (5) ◽  
pp. 864-872 ◽  
Author(s):  
L. Lépine ◽  
M. Provencher ◽  
K. Thammavong ◽  
K. C. Tran ◽  
J. Hubert
Keyword(s):  
Flow Injection ◽  
Atomic Emission ◽  
Background Correction ◽  
Emission Spectrometry ◽  
Wavelength Modulation ◽  
Dynamic Background ◽  
Emission Analysis ◽  
Atomic Emission Analysis ◽  
Background Measurement ◽  
Modulation Control

This paper describes a fast background correction system based on wavelength modulation that can be adapted to any dispersive ICP spectrometer. It consists of a quartz refractor plate which oscillates just behind the entrance slit to perform rapid wavelength scanning across the emission line. The system inertia is small and allows a fast scan rate, which permits real-time background measurement during fast transient signals. It has been successfully applied to flow-injection-ICP-atomic emission analysis (FIA-ICP-AES). A simple and inexpensive interface is presented to perform wavelength modulation control and data acquisition by an IBM-XT microcomputer. Different mathematical approaches are compared to handle the spectral line intensity, as well as the FIA-AES peaks. The result is a simplified and fast data treatment which can be easily handled by any small microcomputer.

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