Morphology and structure of the oxide films formed on 0Kh16N15M3B steel in dissociating N2O4 at 1170?1370�K

1983 ◽  
Vol 54 (5) ◽  
pp. 336-339
Author(s):  
V. N. Vechkanov ◽  
A. N. Khodan ◽  
A. P. Zakharov ◽  
V. P. Isakov ◽  
A. A. Antonov ◽  
...  
Keyword(s):  
Oxide Films ◽  
0Kh16n15m3b Steel ◽  
Morphology And Structure

Functionalization of nanostructured cerium oxide films with histidine

2015 ◽  
Vol 17 (4) ◽  
pp. 2770-2777 ◽  
Author(s):  
Nataliya Tsud ◽  
Sofiia Bercha ◽  
Robert G. Acres ◽  
Mykhailo Vorokhta ◽  
Ivan Khalakhan ◽  
...  
Keyword(s):  
Cerium Oxide ◽  
Oxide Films ◽  
Morphology And Structure ◽  
Adsorption Geometry

The surfaces of cerium oxide films were modified by histidine adsorption in vacuum. It was shown that the morphology and structure of the oxide are decisive factors which define the adsorption geometry of the histidine adlayer.

Morphology and Structure of Oxide Films Formed on Magnesium by Exposure to Air and Water

1995 ◽  
Vol 142 (10) ◽  
pp. 3320-3322 ◽  
Author(s):  
Jan Halvor Nordlien ◽  
Sachiko Ono ◽  
Noburo Masuko ◽  
Kemal Nis¸ancioǦlu
Keyword(s):  
Oxide Films ◽  
Morphology And Structure

Morphology and Structure of Oxide Films Formed on MgAl Alloys by Exposure to Air and Water

1996 ◽  
Vol 143 (8) ◽  
pp. 2564-2572 ◽  
Author(s):  
Jan Halvor Nordlien ◽  
Kemal NişancioǦu ◽  
Sachiko Ono ◽  
Noburo Masuko
Keyword(s):  
Oxide Films ◽  
Morphology And Structure

Resolving Crystallites in Zirconium Oxide Films

1969 ◽  
Vol 27 ◽  
pp. 140-141
Author(s):  
R.A. Ploc
Keyword(s):  
Electron Microscope ◽  
Inelastic Scattering ◽  
Zirconium Oxide ◽  
Oxide Films ◽  
Optic Axis ◽  
Objective Lens ◽  
Microscope Objective ◽  
Linear Optic ◽  
A Current ◽  
Microscope Objective Lens

The optic axis of an electron microscope objective lens is usually assumed to be straight and co-linear with the mechanical center. No reason exists to assume such perfection and, indeed, simple reasoning suggests that it is a complicated curve. A current centered objective lens with a non-linear optic axis when used in conjunction with other lenses, leads to serious image errors if the nature of the specimen is such as to produce intense inelastic scattering.

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

Properties of Transparent Conductive Zinc Oxide Films Deposited on COP Substrates by PLD Method

2009 ◽  
Vol 129 (11) ◽  
pp. 1981-1984
Author(s):  
Yuki Ueno ◽  
Takanori Aoki ◽  
Akio Suzuki ◽  
Tatsuhiko Matsushita ◽  
Masahiro Okuda
Keyword(s):  
Zinc Oxide ◽  
Oxide Films ◽  
Zinc Oxide Films
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