The near-surface structure of ion-implanted and crept molybdenum

1985 ◽  
Vol 20 (10) ◽  
pp. 3771-3777
Author(s):  
I. W. Hall
Keyword(s):  
Surface Structure ◽  
Near Surface ◽  
Ion Implanted

Preparation of Backthinned Ceramic Specimens

1985 ◽  
Vol 43 ◽  
pp. 182-183
Author(s):  
A. T. Fisher ◽  
P. Angelini
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Vacuum System ◽  
Back Surface ◽  
Surface Microstructure ◽  
Ion Milling ◽  
Near Surface ◽  
Depth Profiles ◽  
Analytical Electron ◽  
Ion Implanted

Analytical electron microscopy (AEM) of the near surface microstructure of ion implanted ceramics can provide much information about these materials. Backthinning of specimens results in relatively large thin areas for analysis of precipitates, voids, dislocations, depth profiles of implanted species and other features. One of the most critical stages in the backthinning process is the ion milling procedure. Material sputtered during ion milling can redeposit on the back surface thereby contaminating the specimen with impurities such as Fe, Cr, Ni, Mo, Si, etc. These impurities may originate from the specimen, specimen platform and clamping plates, vacuum system, and other components. The contamination may take the form of discrete particles or continuous films [Fig. 1] and compromises many of the compositional and microstructural analyses. A method is being developed to protect the implanted surface by coating it with NaCl prior to backthinning. Impurities which deposit on the continuous NaCl film during ion milling are removed by immersing the specimen in water and floating the contaminants from the specimen as the salt dissolves.

Investigation of inhomogeneous structures of near-surface-layers in ion-implanted silicon

1998 ◽  
Vol 319 (1-2) ◽  
pp. 39-43 ◽  
Author(s):  
Z Swiatek ◽  
J.T Bonarski ◽  
R Ciach ◽  
Z.T Kuznicki ◽  
I.M Fodchuk ◽  
...  
Keyword(s):  
Surface Layers ◽  
Near Surface ◽  
Ion Implanted

Joint Inversion Scheme of Dispersive Surface Waves for Near-surface Structure Estimation

2015 ◽  
Author(s):  
Tongju Gong* ◽  
Miao Liu ◽  
Yiming Wang ◽  
Zhiwei Zhu ◽  
Baoqing Zhang
Keyword(s):  
Surface Waves ◽  
Surface Structure ◽  
Joint Inversion ◽  
Near Surface ◽  
Structure Estimation

Effect of near-surface band bending on dopant profiles in ion-implanted silicon

2004 ◽  
Vol 95 (3) ◽  
pp. 1134-1140 ◽  
Author(s):  
Michael Y. L. Jung ◽  
Rudiyanto Gunawan ◽  
Richard D. Braatz ◽  
E. G. Seebauer
Keyword(s):  
Surface Band ◽  
Band Bending ◽  
Near Surface ◽  
Dopant Profiles ◽  
Ion Implanted

Near-Surface Structure of Plasma Polymer Films Affects Surface Behavior in Water and its Interaction with Proteins

2018 ◽  
Vol 38 (4) ◽  
pp. 851-870 ◽  
Author(s):  
Marianne Vandenbossche ◽  
Gesine Gunkel-Grabole ◽  
Anja Car ◽  
Laetitia Bernard ◽  
Patrick Rupper ◽  
...  
Keyword(s):  
Surface Structure ◽  
Polymer Films ◽  
Plasma Polymer ◽  
Near Surface ◽  
Surface Behavior
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