Contact electron micrography for characterization of paper in a transmission electron microscope: a new technique

1988 ◽  
Vol 23 (11) ◽  
pp. 3843-3846
Author(s):  
A. V. Moharir ◽  
Nam Prakash
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
New Technique ◽  
Electron Micrography ◽  
Transmission Electron ◽  
A New Technique

scholarly journals Characterization of Li-rich layered oxides by using transmission electron microscope

2017 ◽  
Vol 2 (3) ◽  
pp. 174-185 ◽  
Author(s):  
Hu Zhao ◽  
Bao Qiu ◽  
Haocheng Guo ◽  
Kai Jia ◽  
Zhaoping Liu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Layered Oxides ◽  
Transmission Electron

Characterization of JEOL 3000f TEM Equipped for Electron Holography

2000 ◽  
Vol 6 (S2) ◽  
pp. 228-229
Author(s):  
M. A. Schofield ◽  
Y. Zhu
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Design Of Experiment ◽  
Electron Holography ◽  
Fringe Spacing ◽  
Interference Fringes ◽  
Transmission Electron ◽  
Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

Fabrication and In Situ Transmission Electron Microscope Characterization of Free-Standing Graphene Nanoribbon Devices

ACS Nano ◽  
2016 ◽  
Vol 10 (1) ◽  
pp. 1475-1480 ◽  
Author(s):  
Qing Wang ◽  
Ryo Kitaura ◽  
Shoji Suzuki ◽  
Yuhei Miyauchi ◽  
Kazunari Matsuda ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Graphene Nanoribbon ◽  
Free Standing ◽  
Transmission Electron

Elaboration and characterization of novel polyamide-12-layered titanoniobates nanocomposites

2009 ◽  
Vol 24 (11) ◽  
pp. 3358-3371 ◽  
Author(s):  
Sophie Chausson ◽  
Richard Retoux ◽  
Jean-Michel Rueff ◽  
Loïc LE Pluart ◽  
Pierre-Jean Madec ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Thermomechanical Properties ◽  
Polyamide 12 ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Before And After ◽  
Basic Reaction

This article describes the synthesis and the characterization of a polyamide-12 filled with a nanostructured organic/inorganic titanoniobate hybrid material. The pristine oxide KTiNbO5 has been successfully organomodified by N-alkyl amines via an acido-basic reaction after a cationic exchange step as shown by x-ray diffraction. Transmission electron microscope study and scanning transmission electron microscope observations have been used to describe the change of morphology of the nanofillers before and after processing; the micronic aggregates were changed into single sheets and dispersed in the polymer. Thermomechanical properties of the composites have been determined, and their analyses with structure-properties models are consistent with the exfoliation of the organomodified titanoniobates.

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