Two orthogonally polarized optical beams in a family of Kerr-law nonlinear shifted parabolic graded-index rod lenses

1996 ◽  
Vol 63 (2) ◽  
pp. 161-166
Author(s):  
Y. Li
Keyword(s):  
Graded Index ◽  
Kerr Law ◽  
Optical Beams

Propagation of Optical Beams through a Circularly Curved Graded-index Fibre

1978 ◽  
Vol 25 (1) ◽  
pp. 1-18 ◽  
Author(s):  
A.K. Ghatak ◽  
I.C. Goyal ◽  
Anjana Gupta
Keyword(s):  
Graded Index ◽  
Index Fibre ◽  
Optical Beams

The Influence of Optical Beams on Semiconductor Devices During Failure Analysis

2002 ◽  
Author(s):  
Charles Zhang ◽  
Matt Thayer ◽  
Lowell Herlinger ◽  
Greg Dabney ◽  
Manuel Gonzalez
Keyword(s):  
Failure Analysis ◽  
Semiconductor Devices ◽  
Laser Wavelength ◽  
Fault Isolation ◽  
Analysis Techniques ◽  
Cmos Transistor ◽  
Optical Beams

Abstract A number of backside analysis techniques rely on the successful use of optical beams in performing backside fault isolation. In this paper, the authors have investigated the influence of the 1340 nm and 1064 nm laser wavelength on advanced CMOS transistor performance.

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