The problem of the extensions of a positve definite sequence of second-order Toeplitz matrices

1990 ◽  
Vol 42 (9) ◽  
pp. 1142-1144
Author(s):  
R. A. Ugrinovskii
Keyword(s):  
Toeplitz Matrices ◽  
Second Order ◽  
Definite Sequence

scholarly journals Toeplitz Matrices in the Problem of Semiscalar Equivalence of Second-Order Polynomial Matrices

2017 ◽  
Vol 2017 ◽  
pp. 1-14 ◽  
Author(s):  
B. Z. Shavarovskii
Keyword(s):  
Equivalence Relation ◽  
Polynomial Matrix ◽  
Toeplitz Matrices ◽  
Sufficient Conditions ◽  
Second Order ◽  
Necessary And Sufficient Conditions ◽  
Polynomial Matrices ◽  
Order Polynomial ◽  
Necessary And Sufficient

We consider the problem of determining whether two polynomial matrices can be transformed to one another by left multiplying with some nonsingular numerical matrix and right multiplying by some invertible polynomial matrix. Thus the equivalence relation arises. This equivalence relation is known as semiscalar equivalence. Large difficulties in this problem arise already for 2-by-2 matrices. In this paper the semiscalar equivalence of polynomial matrices of second order is investigated. In particular, necessary and sufficient conditions are found for two matrices of second order being semiscalarly equivalent. The main result is stated in terms of determinants of Toeplitz matrices.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Second order interference in two photon absorption

1996 ◽  
Vol 43 (9) ◽  
pp. 1765-1771 ◽  
Author(s):  
M. W. HAMILTON and D. S. ELLIOTT
Keyword(s):  
Second Order ◽  
Photon Absorption ◽  
Two Photon Absorption ◽  
Two Photon
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