Impurity and defect diffusion and flicker fluctuations in number of carriers in conductive media

1980 ◽  
Vol 23 (2) ◽  
pp. 170-174 ◽  
Author(s):  
A. V. Yakimov
Keyword(s):  
Defect Diffusion ◽  
Conductive Media

Influence of long-term defect diffusion on HgCdTe electronic structure

2004 ◽  
Vol 27 (1-3) ◽  
pp. 403-406
Author(s):  
M. Pociask ◽  
B. Pukowska ◽  
A. Kisiel ◽  
E. M. Sheregii ◽  
N. N. Berchenko
Keyword(s):  
Electronic Structure ◽  
Defect Diffusion

Retention coefficients and thermal release profiles of ion-injected argon from silicates and iron

1970 ◽  
Vol 48 (12) ◽  
pp. 1472-1479
Author(s):  
Harry C. Lord III
Keyword(s):  
Volume Diffusion ◽  
Ion Irradiation ◽  
Defect Diffusion ◽  
Substrate Composition ◽  
Retention Coefficient ◽  
Thermal Release ◽  
Argon Concentration ◽  
Cold Rolled ◽  
Argon Ions ◽  
Release Profiles

Thermal release profiles and retention coefficients of injected argon ions were investigated as functions of substrate composition and prior ion-irradiation history. Samples of forsterite, enstatite, oligoclase, obsidian, and cold-rolled steel were irradiated with various sequences of 1 keV H+, 4 keV He+, and 40 keV Ar+. The release temperature of the maximum argon concentration was found to be a function of incident Ar+ dose and pre-irradiation history but not substrate composition. The hydrogen or helium pre-irradiation converted the volume diffusion argon release to a low temperature defect diffusion release. An increase in the incident dose of Ar+ ions resulted in increasing the percentage of the argon released by defect diffusion, and also decreased the argon retention coefficient.

Steady-state point-defect diffusion profiles in solids during irradiation

1974 ◽  
Vol 23 (1) ◽  
pp. 53-59 ◽  
Author(s):  
Nghi Q. Lam ◽  
Steven J. Rothman ◽  
Rudolf Sizmanns
Keyword(s):  
Steady State ◽  
Point Defect ◽  
Defect Diffusion ◽  
State Point ◽  
Diffusion Profiles

Solitons, defect diffusion, and dielectric relaxation of polymers

1980 ◽  
Vol 73 (8) ◽  
pp. 4022-4025 ◽  
Author(s):  
James L. Skinner ◽  
Peter G. Wolynes
Keyword(s):  
Dielectric Relaxation ◽  
Defect Diffusion

Local activation of light-induced degradation in co-doped boron-phosphorus silicon: Evidence of defect diffusion phenomena

2021 ◽  
Vol 135 ◽  
pp. 106104
Author(s):  
M. Najjar ◽  
B. Dridi Rezgui ◽  
M. Bouaicha ◽  
O. Palais ◽  
B. Bessais ◽  
...  
Keyword(s):  
Defect Diffusion ◽  
Local Activation ◽  
Diffusion Phenomena ◽  
Co Doped

scholarly journals MMonCa: An Object Kinetic Monte Carlo simulator for damage irradiation evolution and defect diffusion

2013 ◽  
Vol 184 (12) ◽  
pp. 2703-2710 ◽  
Author(s):  
Ignacio Martin-Bragado ◽  
Antonio Rivera ◽  
Gonzalo Valles ◽  
Jose Luis Gomez-Selles ◽  
María J. Caturla
Keyword(s):  
Monte Carlo ◽  
Kinetic Monte Carlo ◽  
Defect Diffusion ◽  
Object Kinetic Monte Carlo ◽  
Monte Carlo Simulator
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