Theoretical analysis of a coated single-mode fiber termination

1990 ◽  
Vol 11 (9) ◽  
pp. 1073-1097 ◽  
Author(s):  
C. N. Capsalis ◽  
I. Tigelis ◽  
N. Konstantinidis
2012 ◽  
Vol 30 (3) ◽  
pp. 362-367 ◽  
Author(s):  
Mohammad Karimi ◽  
F. Surre ◽  
Tong Sun ◽  
K. T. V. Grattan ◽  
W. Margulis ◽  
...  

2019 ◽  
Vol 9 (16) ◽  
pp. 3296
Author(s):  
Yongkai Liu ◽  
Jianli Wang ◽  
Lie Ma ◽  
Shijie Gao ◽  
Chenzi Guo ◽  
...  

In this study, Zernike polynomials and optical fiber field theory are applied to build a mathematical model of coupling efficiency (CE) and spatial mode of aberrations. The theory built in this paper can be used to quickly calculate the CE affected by a single aberration as well as the aberrations caused by atmospheric turbulence. The aberrations are classified based on Zernike polynomials and the effects of aberrations on CE of different types and different spatial frequencies are analyzed. The influence of the effects of AO system residual errors is also analyzed. Adaptive optics (AO) equipment is applied to build a system on which the proposed theory was tested; the experimental results validate the theoretical analysis.


2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.


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