Energy spectrum of trapping centers in single crystal CdGa2Se4

1978 ◽  
Vol 21 (4) ◽  
pp. 517-519 ◽  
Author(s):  
V. F. Synorov ◽  
N. N. Bezryadin ◽  
A. P. Rovinskii ◽  
B. I. Sysoev
Keyword(s):  
Energy Spectrum ◽  
Single Crystal ◽  
Trapping Centers

Investigation of `glitches' in the energy spectrum induced by single-crystal diamond compound X-ray refractive lenses

2019 ◽  
Vol 26 (1) ◽  
pp. 109-118 ◽  
Author(s):  
Qiuyuan Zhang ◽  
Maxim Polikarpov ◽  
Nataliya Klimova ◽  
Helge B. Larsen ◽  
Ragnvald Mathiesen ◽  
...  
Keyword(s):  
Energy Spectrum ◽  
Single Crystal ◽  
Beam Divergence ◽  
Appreciable Effect ◽  
X Ray ◽  
Diamond Sample ◽  
Diamond Plate ◽  
Incoming Beam ◽  
Single Crystal Diamond ◽  
Set Up

Single-crystal diamond stands out among all the candidate materials that could be exploited to fabricate compound refractive lenses (CRLs) owing to its extremely stable properties. Among all related experimental features, beam divergence, χ-angles relative to the incoming beam in Eulerian geometry and different positions of the X-ray beam relative to the lens geometry may influence the transmission energy spectrum of CRLs. In addition, the orientation of the single-crystal diamond sample may also affect the glitches significantly. To verify these initial assumptions, two experiments, an energy scan and an ω-scan, were set up by employing a polished diamond plate consisting of five biconcave lenses. The results show that beam divergence does not affect the spectrum, nor do χ-angles when ω is set to zero. Nevertheless, different incident positions have an appreciable effect on the transmission spectrum, in particular the `strengths' of the glitches. This is attributed to absorption. The ω-scan setup is capable of determining the so-called orientation matrix, which may be used to predict both `energy positions' and `strengths' of the glitches.

scholarly journals Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration

Crystals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 504
Author(s):  
Nataliya Klimova ◽  
Oleksandr Yefanov ◽  
Irina Snigireva ◽  
Anatoly Snigirev
Keyword(s):  
Energy Spectrum ◽  
Single Crystal ◽  
Unit Cell Parameters ◽  
Optical Elements ◽  
Ray Optics ◽  
X Ray ◽  
Cell Parameters ◽  
Arbitrary Configuration ◽  
Negative Effect

X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics—the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to simulate the glitch spectrum in any configuration. Here, we demonstrate the way of precisely determining the crystallographic orientation and unit cell parameters of optical elements just from a small glitch spectrum with the consequent possibility of simulating glitches for any energy.

Investigation of the energy spectrum and dose response of optical absorption bands in 4N single crystal LiF and LiF:Mg,Ti (TLD-100)

2017 ◽  
Vol 106 ◽  
pp. 30-34 ◽  
Author(s):  
S. Biderman ◽  
S. Druzhyna ◽  
G. Reshes ◽  
I. Eliyahu ◽  
L. Oster ◽  
...  
Keyword(s):  
Energy Spectrum ◽  
Optical Absorption ◽  
Single Crystal ◽  
Dose Response ◽  
Absorption Bands

Energy spectrum of electron trapping centers in CuInAsS3

2016 ◽  
Vol 58 (12) ◽  
pp. 2457-2459 ◽  
Author(s):  
E. M. Zobov ◽  
A. Yu. Mollaev ◽  
L. A. Saipulaeva ◽  
A. G. Alibekov ◽  
N. V. Melnikova
Keyword(s):  
Energy Spectrum ◽  
Electron Trapping ◽  
Trapping Centers

A Preparation of High Resolution Standards for Electron Microscopy. Part II

1971 ◽  
Vol 29 ◽  
pp. 160-161
Author(s):  
Akira Tanaka ◽  
David F. Harling
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Single Crystal ◽  
Dark Field ◽  
Graphitized Carbon Black ◽  
Graphitized Carbon ◽  
Dark Field Imaging ◽  
Crystal Films ◽  
Micro Holes

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.

Structure of Palladium Single-Crystal Films Prepared by Flash Evaporation onto (001) NaCl Substrates

1970 ◽  
Vol 28 ◽  
pp. 456-457
Author(s):  
L. E. Murr ◽  
G. Wong
Keyword(s):  
Single Crystal ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
High Rate ◽  
Flash Evaporation ◽  
Optimum Load ◽  
Single Crystal Films ◽  
Crystal Films ◽  
A Current

Palladium single-crystal films have been prepared by Matthews in ultra-high vacuum by evaporation onto (001) NaCl substrates cleaved in-situ, and maintained at ∼ 350° C. Murr has also produced large-grained and single-crystal Pd films by high-rate evaporation onto (001) NaCl air-cleaved substrates at 350°C. In the present work, very large (∼ 3cm2), continuous single-crystal films of Pd have been prepared by flash evaporation onto air-cleaved (001) NaCl substrates at temperatures at or below 250°C. Evaporation rates estimated to be ≧ 2000 Å/sec, were obtained by effectively short-circuiting 1 mil tungsten evaporation boats in a self-regulating system which maintained an optimum load current of approximately 90 amperes; corresponding to a current density through the boat of ∼ 4 × 104 amperes/cm2.

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