Stability of a row of fibers in an elastic matrix with finite strains

M. S. Babaev

doi:10.1007/bf00886852

Stability of a row of fibers in an elastic matrix with finite strains

Soviet Applied Mechanics ◽

10.1007/bf00886852 ◽

1986 ◽

Vol 22 (1) ◽

pp. 6-11

Author(s):

M. S. Babaev

Keyword(s):

Finite Strains ◽

Elastic Matrix ◽

Row Of Fibers

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Stability of a row of noncircular cylinders in an elastic matrix with finite strains

Soviet Applied Mechanics ◽

10.1007/bf00888841 ◽

1990 ◽

Vol 26 (10) ◽

pp. 929-933 ◽

Cited By ~ 1

Author(s):

D. A. Musaev ◽

F. M. Nagiev

Keyword(s):

Finite Strains ◽

Elastic Matrix

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Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100065079 ◽

1971 ◽

Vol 29 ◽

pp. 204-205

Author(s):

G. G. Shaw

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Alloy ◽

Electron Beam ◽

Pure Aluminum ◽

Ion Milling ◽

Transmission Electron ◽

Fiber Matrix ◽

Ion Erosion ◽

Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

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