Direct comparison of ion scattering and secondary ion emission as tools for analysis of metal surfaces

1974 ◽  
Vol 4 (3) ◽  
pp. 243-248 ◽  
Author(s):  
M. Grundner ◽  
W. Heiland ◽  
E. Taglauer
2018 ◽  
Vol 19 (1) ◽  
pp. 49-69 ◽  
Author(s):  
V. T. Cherepin ◽  
M. O. Vasylyev ◽  
I. M. Makeeva ◽  
V. M. Kolesnik ◽  
S. M. Voloshko

1990 ◽  
Vol 102 (1-3) ◽  
pp. 71-78 ◽  
Author(s):  
Margarete M. Brudny ◽  
Wolfgang Rybczynski ◽  
Wolfhart Seidel ◽  
Dieter Thiel

1987 ◽  
Vol 35 (16) ◽  
pp. 8330-8340 ◽  
Author(s):  
M. C. G. Passeggi ◽  
E. C. Goldberg ◽  
J. Ferrón

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