Measurement of loss changes in the waveguide of a low-temperature millimeter-wave noise generator in the 295?77�K temperature interval

1986 ◽  
Vol 29 (2) ◽  
pp. 141-142
Author(s):  
V. A. Gol'ba ◽  
O. G. Petrosyan ◽  
S. P. Bykov
Keyword(s):  
Low Temperature ◽  
Temperature Interval ◽  
Millimeter Wave ◽  
Noise Generator

An Improved Low-Temperature Brittleness Test

1949 ◽  
Vol 22 (3) ◽  
pp. 820-827 ◽  
Author(s):  
E. F. Smith ◽  
G. J. Dienes
Keyword(s):  
Low Temperature ◽  
Temperature Interval ◽  
Statistical Study ◽  
Distribution Curve ◽  
Simple Analysis ◽  
Reasonable Amount ◽  
Brittle Point

Abstract An improved low-temperature brittleness tester, capable of testing five specimens simultaneously, is described. All machine specifications conform to A.S.T.M. Method D 746-44T. Data are presented which show that many elastomers do not possess a sharp brittle point but are characterized by a distribution of failures over a temperature interval. The improved brittleness tester makes it possible to carry out the necessary statistical study of the distribution of per cent failures versus temperature with a reasonable amount of work. A simple analysis of the resulting distribution curve is presented.

scholarly journals Low temperature penetration depth and the effect of quasi-particle scattering measured by millimeter wave transmission in YBa Cu O thin films

1998 ◽  
Vol 5 (4-6) ◽  
pp. 847-858 ◽  
Author(s):  
S. Djordjevic ◽  
L.A. de Vaulchier ◽  
N. Bontemps ◽  
J.P. Vieren ◽  
Y. Guldner ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Penetration Depth ◽  
Millimeter Wave ◽  
Wave Transmission ◽  
Particle Scattering ◽  
Quasi Particle

Introducing DuPont™ GreenTape™ 9K5 Low Dielectric Constant, Low Temperature Co-Fired Ceramic (LTCC) Tape System

2011 ◽  
Vol 2011 (1) ◽  
pp. 000544-000552
Author(s):  
Deepukumar M. Nair ◽  
James Parisi ◽  
K.M. Nair ◽  
Mark McCombs ◽  
Michael Smith ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Millimeter Wave ◽  
High Speed ◽  
High Reliability ◽  
Signal Propagation ◽  
Dielectric Constants ◽  
Low Dielectric Constant ◽  
Material System ◽  
Low Dielectric

Low Temperature Co-fired Ceramic (LTCC) material systems have been successfully used in microwave and millimeter wave systems for several years. LTCC has very low dielectric loss, high reliability due to inherent hermeticity; high interconnect density, multilayer processing capability leading to true 3D packaging, and better cost-performance balance. While the medium range dielectric constants (7.00 – 8.00) offered by current tape systems have advantages, it is generally difficult to realize high speed systems and efficient antennas on LTCC, especially at millimeter wave frequencies. The difficulty arises from the reduced signal propagation velocity in high-speed applications, and lower radiation efficiency for antennas, both due to higher dielectric constant. To enable and extend applications of LTCC technology to these subsystems, DuPont has developed a new low dielectric constant LTCC system – DuPont™ GreenTape™ 9K5 - which has a dielectric constant of 5.80 (at 10 GHz) that is compatible with the commercial DuPont™ GreenTape™ 9K7 LTCC System. This is achieved without compromising excellent microwave loss properties of the 9KX GreenTape™ platform. These materials systems enable high-speed, high reliability applications while also realizing efficient antennas on LTCC. This paper presents initial characterization of the new DuPont™ GreenTape™ 9K5 LTCC system consisting of low K dielectric tape, gold and silver conductors to evaluate the effects of chemistry, processing conditions, processing latitude, microstructure, and microwave performance. Test coupons with various transmission and resonating structures are designed, fabricated, and tested for the evaluation of transmission losses and dielectric properties. Stability of the material system over multiple re-fire steps is also examined

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