Separate magnitude and phase measurement of passive two-terminal networks by the substitution method

1973 ◽  
Vol 16 (8) ◽  
pp. 1209-1211
Author(s):  
L. �. Degtyar' ◽  
Z. I. Zelikovskii
Keyword(s):  
Phase Measurement ◽  
Substitution Method

Performance and applications of the holography electron microscope

1993 ◽  
Vol 51 ◽  
pp. 1078-1079
Author(s):  
Akira Tonomura
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Phase Measurement ◽  
Electron Holography ◽  
Imaging Method ◽  
High Contrast ◽  
Magnetic Lens ◽  
High Brightness ◽  
Holographic Imaging ◽  
Dynamic Observation

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.

Comments on "An accurate digital phase measurement scheme"

1985 ◽  
Vol 73 (3) ◽  
pp. 490-491
Author(s):  
J.M. Carr ◽  
T.S. Rathore
Keyword(s):  
Phase Measurement ◽  
Measurement Scheme ◽  
Digital Phase

scholarly journals High-Quality Pixel Selection Applied for Natural Scenes in GB-SAR Interferometry

2021 ◽  
Vol 13 (9) ◽  
pp. 1617
Author(s):  
Yunkai Deng ◽  
Weiming Tian ◽  
Ting Xiao ◽  
Cheng Hu ◽  
Hong Yang
Keyword(s):  
Phase Measurement ◽  
High Amplitude ◽  
Sar Interferometry ◽  
Spatial Density ◽  
Natural Scenes ◽  
Sar Images ◽  
High Quality ◽  
Temporal Phase ◽  
Permanent Scatterers ◽  
High Phase

Phase analysis based on high-quality pixel (HQP) is crucial to ensure the measurement accuracy of ground-based SAR (GB-SAR). The amplitude dispersion (ADI) criterion has been widely applied to identify pixels with high amplitude stability, i.e., permanent scatterers (PSs), which typically are point-wise scatterers such as stones or man-made structures. However, the PS number in natural scenes is few and limits the GB-SAR applications. This paper proposes an improved method to take HQP selection applied for natural scenes in GB-SAR interferometry. In order to increase the spatial density of HQP for phase measurement, three types of HQPs including PS, quasi-permanent scatter (QPS), and distributed scatter (DS), are selected with different criteria. The ADI method is firstly utilized to take PS selection. To select those pixels with high phase stability but moderate amplitude stability, the temporal phase coherence (TPC) is defined. Those pixels with moderate ADI values and high TPC are selected as QPSs. Then the feasibility of the DS technique is explored. To validate the feasibility of the proposed method, 2370 GB-SAR images of a natural slope are processed. Experimental results prove that the HQP number could be significantly increased while slightly sacrificing phase quality.

Phase-Shifting Electron Holography for Accurate Measurement of Potential Distributions in Organic and Inorganic Semiconductors

Microscopy ◽  
2020 ◽  
Author(s):  
Kazuo Yamamoto ◽  
Satoshi Anada ◽  
Takeshi Sato ◽  
Noriyuki Yoshimoto ◽  
Tsukasa Hirayama
Keyword(s):  
High Performance ◽  
Focused Ion Beam ◽  
Phase Measurement ◽  
Ion Beam ◽  
Functional Materials ◽  
Phase Shifting ◽  
Future Research ◽  
Electron Holography ◽  
Preparation Technique ◽  
Inorganic Semiconductors

Abstract Phase-shifting electron holography (PS-EH) is an interference transmission electron microscopy technique that accurately visualizes potential distributions in functional materials, such as semiconductors. In this paper, we briefly introduce the features of the PS-EH that overcome some of the issues facing the conventional EH based on Fourier transformation. Then, we present a high-precision PS-EH technique with multiple electron biprisms and a sample preparation technique using a cryo-focused-ion-beam, which are important techniques for the accurate phase measurement of semiconductors. We present several applications of PS-EH to demonstrate the potential in organic and inorganic semiconductors and then discuss the differences by comparing them with previous reports on the conventional EH. We show that in situ biasing PS-EH was able to observe not only electric potential distribution but also electric field and charge density at a GaAs p-n junction and clarify how local band structures, depletion layer widths, and space charges changed depending on the biasing conditions. Moreover, the PS-EH clearly visualized the local potential distributions of two-dimensional electron gas (2DEG) layers formed at AlGaN/GaN interfaces with different Al compositions. We also report the results of our PS-EH application for organic electroluminescence (OEL) multilayers and point out the significant potential changes in the layers. The proposed PS-EH enables more precise phase measurement compared to the conventional EH, and our findings introduced in this paper will contribute to the future research and development of high-performance semiconductor materials and devices.

Synchronization in Dual Delay Line SAW Sensors

2004 ◽  
Author(s):  
Duck-Bong Seo ◽  
Z. C. Feng
Keyword(s):  
Delay Line ◽  
Phase Measurement ◽  
Surface Adsorption ◽  
Propagation Speed ◽  
Frequency Measurement ◽  
Frequency Change ◽  
Averaged Equations ◽  
Excited Oscillation ◽  
The Difference ◽  
Delay Differential

Surface acoustic wave (SAW) sensors are self-excited oscillators. Self-excitation is a consequence of the finite amount of delay in the circuit. The oscillation frequency is affected by the wave propagation speed which further depends on surface adsorption. Therefore, measurement on the surface adsorption is done by measuring the frequency change of the self-excited oscillation. In dual delay line oscillators the difference between the surface physical conditions is reflected through the difference in oscillation frequencies. Delay differential equations are used to model the sensor. Bifurcation analysis of the averaged equations indicates the presence of synchronization. The occurrence of synchronization is further demonstrated through numerical simulations. Synchronization makes the frequency measurement irrelevant. We propose phase measurement as an alternative in the presence of strong coupling between the two oscillators.

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