Determination of the efficiency of electron capture center parameters in the MOS structure dielectric layer
2008 ◽
2016 ◽
2019 ◽
Keyword(s):
1984 ◽
Vol 291
◽
pp. 409-415
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2006 ◽
Vol 61
(5-6)
◽
pp. 341-346
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1985 ◽
Vol 26
(6)
◽
pp. 658-661_1
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Keyword(s):