High resolution electron microscopy characterization of sulfided palladium particles on amorphous SiO2
2011 ◽
Vol 62
(4)
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pp. 438-441
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2016 ◽
Vol 307
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pp. 428-435
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1994 ◽
Vol 52
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pp. 756-757
1996 ◽
Vol 99
(3)
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pp. 213-220
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1995 ◽
Vol 3
(4-5)
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pp. 409-418
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