The connection between the chemical structure of urea derivatives and their antispasmodic activity

1973 ◽  
Vol 7 (1) ◽  
pp. 18-20
Author(s):  
A. G. Pechenkin ◽  
L. G. Tignibidina ◽  
A. P. Gulev ◽  
V. K. Gorshkova ◽  
V. M. Kurilenko
Keyword(s):  
Chemical Structure ◽  
Antispasmodic Activity ◽  
Urea Derivatives

The relationship of chemical structure of urea derivatives to antispasmodic activity

1979 ◽  
Vol 13 (5) ◽  
pp. 497-499
Author(s):  
A. G. Pechenkin ◽  
L. G. Tugnibidina ◽  
V. K. Gorshkova ◽  
L. A. Tikhonova
Keyword(s):  
Chemical Structure ◽  
Antispasmodic Activity ◽  
Urea Derivatives ◽  
Relationship Of ◽  
The Relationship

Relationship of the chemical structure of urea derivatives to antispasmodic activity

1972 ◽  
Vol 6 (7) ◽  
pp. 451-453 ◽  
Author(s):  
A. G. Pechenkin ◽  
L. G. Tignibidina ◽  
A. P. Gilev ◽  
V. K. Gorshkova ◽  
V. M. Kurilenko
Keyword(s):  
Chemical Structure ◽  
Antispasmodic Activity ◽  
Urea Derivatives ◽  
Relationship Of

ChemInform Abstract: RELATIONSHIP OF THE CHEMICAL STRUCTURE OF UREA DERIVATIVES TO ANTISPASMODIC ACTIVITY

1973 ◽  
Vol 4 (43) ◽  
pp. no-no
Author(s):  
A. G. PECHENKIN ◽  
L. G. TIGNIBIDINA ◽  
A. P. GILEV ◽  
V. K. GORSHKOVA ◽  
V. M. KURILENKO
Keyword(s):  
Chemical Structure ◽  
Antispasmodic Activity ◽  
Urea Derivatives ◽  
Relationship Of

Inelastic Electron-Matter Interactions

1978 ◽  
Vol 36 (3) ◽  
pp. 259-267
Author(s):  
J. Silcox
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Chemical Structure ◽  
Inelastic Electron ◽  
Primary Concern ◽  
Unique Probe ◽  
Introductory Paper ◽  
Elastic Processes ◽  
Experimental Level ◽  
Inelastic Processes

In this introductory paper, my primary concern will be in identifying and outlining the various types of inelastic processes resulting from the interaction of electrons with matter. Elastic processes are understood reasonably well at the present experimental level and can be regarded as giving information on spatial arrangements. We need not consider them here. Inelastic processes do contain information of considerable value which reflect the electronic and chemical structure of the sample. In combination with the spatial resolution of the electron microscope, a unique probe of materials is finally emerging (Hillier 1943, Watanabe 1955, Castaing and Henri 1962, Crewe 1966, Wittry, Ferrier and Cosslett 1969, Isaacson and Johnson 1975, Egerton, Rossouw and Whelan 1976, Kokubo and Iwatsuki 1976, Colliex, Cosslett, Leapman and Trebbia 1977). We first review some scattering terminology by way of background and to identify some of the more interesting and significant features of energy loss electrons and then go on to discuss examples of studies of the type of phenomena encountered. Finally we will comment on some of the experimental factors encountered.

Chemical structure of diamond-like carbon thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 710-711
Author(s):  
N.-H. Cho ◽  
K.M. Krishnan ◽  
D.B. Bogy
Keyword(s):  
Electrical Resistivity ◽  
Chemical Structure ◽  
Diamond Like Carbon ◽  
Chemical Structures ◽  
Sputtering Power ◽  
Data Aquisition ◽  
Equilibrium Phases ◽  
Electron Energy Loss ◽  
Power Densities ◽  
Preparation Techniques

Diamond-like carbon (DLC) films have attracted much attention due to their useful properties and applications. These properties are quite variable depending on film preparation techniques and conditions, DLC is a metastable state formed from highly non-equilibrium phases during the condensation of ionized particles. The nature of the films is therefore strongly dependent on their particular chemical structures. In this study, electron energy loss spectroscopy (EELS) was used to investigate how the chemical bonding configurations of DLC films vary as a function of sputtering power densities. The electrical resistivity of the films was determined, and related to their chemical structure.DLC films with a thickness of about 300Å were prepared at 0.1, 1.1, 2.1, and 10.0 watts/cm2, respectively, on NaCl substrates by d.c. magnetron sputtering. EEL spectra were obtained from diamond, graphite, and the films using a JEOL 200 CX electron microscope operating at 200 kV. A Gatan parallel EEL spectrometer and a Kevex data aquisition system were used to analyze the energy distribution of transmitted electrons. The electrical resistivity of the films was measured by the four point probe method.

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