Caloric equation of state of silicon oxide and of a silicone liquid

1972 ◽  
Vol 8 (3) ◽  
pp. 346-350
Author(s):  
V. E. Fortov
1973 ◽  
Vol 6 (5) ◽  
pp. 559-561
Author(s):  
A. L. Tsykalo ◽  
Zh. F. Doroshenko ◽  
V. K. Savenkov

2009 ◽  
Vol 4 (1) ◽  
pp. 80-84
Author(s):  
Evgeniy Prokhorov

As a caloric equation of state of a mixed ideal gas it has been suggested to use the empirical formula for the internal energy derived from the known molecular-kinetic approaches. The formula allows to calculate with high degree accuracy the internal energy and the heat capacity of a mixed gas with components involving only mono- and diatomic molecules.


Author(s):  
M. Raghavan ◽  
J. Y. Koo ◽  
J. W. Steeds ◽  
B. K. Park

X-ray microanalysis and Convergent Beam Electron Diffraction (CBD) studies were conducted to characterize the second phase particles in two commercial aluminum alloys -- 7075 and 7475. The second phase particles studied were large (approximately 2-5μm) constituent phases and relatively fine ( ∼ 0.05-1μn) dispersoid particles, Figures 1A and B. Based on the crystal structure and chemical composition analyses, the constituent phases found in these alloys were identified to be Al7Cu2Fe, (Al,Cu)6(Fe,Cu), α-Al12Fe3Si, Mg2Si, amorphous silicon oxide and the modified 6Fe compounds, in decreasing order of abundance. The results of quantitative X-ray microanalysis of all the constituent phases are listed in Table I. The data show that, in almost all the phases, partial substitution of alloying elements occurred resulting in small deviations from the published stoichiometric compositions of the binary and ternary compounds.


Author(s):  
James B. Pawley

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.


1998 ◽  
Vol 94 (5) ◽  
pp. 809-814 ◽  
Author(s):  
C. BARRIO ◽  
J.R. SOLANA

2000 ◽  
Vol 10 (PR5) ◽  
pp. Pr5-281-Pr5-286
Author(s):  
M. Ross ◽  
L. H. Yang ◽  
G. Galli

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