Surface characterization of carbon black modified by oxygen plasma

1989 ◽  
Vol 8 (11) ◽  
pp. 1269-1270 ◽  
Author(s):  
Masamitsu Oshikiri ◽  
Tetsuro Yokono ◽  
Yuzo Sanada
Keyword(s):  
Carbon Black ◽  
Surface Characterization ◽  
Oxygen Plasma

Surface modification and characterization of carbon black with oxygen plasma

Carbon ◽  
1996 ◽  
Vol 34 (9) ◽  
pp. 1087-1091 ◽  
Author(s):  
T. Takada ◽  
M. Nakahara ◽  
H. Kumagai ◽  
Y. Sanada
Keyword(s):  
Surface Modification ◽  
Carbon Black ◽  
Oxygen Plasma

scholarly journals XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes

2010 ◽  
Vol 16 (S2) ◽  
pp. 442-443 ◽  
Author(s):  
BR Strohmeier ◽  
JD Piasecki ◽  
KL Bunker ◽  
JL Sturgeon ◽  
BA Stitch ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Activated Carbon ◽  
Carbon Black ◽  
Surface Characterization ◽  
Characterization Of Activated Carbon

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals Characterization of pitch/oxygen plasma treated carbon black systems by means of high temperature ESR

TANSO ◽  
1989 ◽  
Vol 1989 (140) ◽  
pp. 306-309 ◽  
Author(s):  
Masamitsu Oshikiri ◽  
Tetsuro Yokono ◽  
Yuzo Sanada
Keyword(s):  
High Temperature ◽  
Carbon Black ◽  
Oxygen Plasma ◽  
Treated Carbon

Surface characterization of synthetic vulcanized rubber treated with oxygen plasma

1998 ◽  
Vol 26 (5) ◽  
pp. 385-399 ◽  
Author(s):  
M. Mercedes Pastor-Blas ◽  
José Miguel Martín-Martínez ◽  
John G. Dillard
Keyword(s):  
Surface Characterization ◽  
Oxygen Plasma ◽  
Vulcanized Rubber

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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