Characterization of defects in amorphous type II superconductors using the collective flux pinning properties

1988 ◽  
Vol 70 (3-4) ◽  
pp. 253-277 ◽  
Author(s):  
R. W�rdenweber ◽  
A. Pruymboom ◽  
P. H. Kes
Keyword(s):  
Flux Pinning ◽  
Type Ii ◽  
Type Ii Superconductors ◽  
Pinning Properties

Flux pinning in thermodynamically reversible type II superconductors

Cryogenics ◽  
1969 ◽  
Vol 9 (2) ◽  
pp. 119-121 ◽  
Author(s):  
E.L. Andronikashvili ◽  
J.G. Chivinadze ◽  
R.M. Kerr ◽  
J. Lowell ◽  
K. Mendelssohn ◽  
...  
Keyword(s):  
Flux Pinning ◽  
Type Ii ◽  
Type Ii Superconductors

DEPENDENCE OF CRITICAL CURRENT ON TEMPERATURE FOR DIRTY TYPE-II SUPERCONDUCTORS

1989 ◽  
Vol 03 (06) ◽  
pp. 489-492
Author(s):  
Z. YU ◽  
S.Y. DING ◽  
K.X. SHI ◽  
J.L. YAN
Keyword(s):  
Temperature Dependence ◽  
Critical Current ◽  
Electron Scattering ◽  
Flux Pinning ◽  
Multilayer Films ◽  
Experimental Results ◽  
Type Ii ◽  
Defect Model ◽  
Pinning Mechanism ◽  
Type Ii Superconductors

Based on the non-ideal planar defect model developed by the authors earlier and electron scattering flux pinning mechanism, we have derived a temperature dependence of critical current which predicts a same relation for both of I c and H c2 in dirty type-II superconductors. In order to test the prediction, the I c (T) and H c2 (T) were measured on PbBi-SiO multilayer films. The agreement between the theoretical and experimental results is satisfactory.

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