A review of the role of short-circuit diffusion in the oxidation of nickel, chromium, and nickel-chromium alloys

1985 ◽  
Vol 24 (3-4) ◽  
pp. 177-197 ◽  
Author(s):  
H. V. Atkinson
Keyword(s):  
Short Circuit ◽  
Nickel Chromium ◽  
Chromium Alloys ◽  
Short Circuit Diffusion

scholarly journals Interface sharpening in miscible and isotopic multilayers: Role of short-circuit diffusion

2019 ◽  
Vol 99 (20) ◽  
Author(s):  
A. Tiwari ◽  
M. K. Tiwari ◽  
M. Gupta ◽  
H.-C. Wille ◽  
A. Gupta
Keyword(s):  
Short Circuit ◽  
Short Circuit Diffusion

scholarly journals Argon release mechanisms of biotite in vacuo and the role of short-circuit diffusion and recoil

2000 ◽  
Vol 165 (1-2) ◽  
pp. 135-166 ◽  
Author(s):  
Ching-Hua Lo ◽  
James K.W Lee ◽  
Tullis C Onstott
Keyword(s):  
Short Circuit ◽  
Release Mechanisms ◽  
Short Circuit Diffusion

Structural Imperfections in thin Oxide Films Formed on Some Fe- and Ni-Base Alloys

1970 ◽  
Vol 28 ◽  
pp. 510-511
Author(s):  
L. P. Lemaire ◽  
D. E. Fornwalt ◽  
F. S. Pettit ◽  
B. H. Kear
Keyword(s):  
Oxide Scale ◽  
Oxidation Process ◽  
Short Circuit ◽  
Protective Oxide ◽  
Protective Oxide Scale ◽  
Thin Oxide Films ◽  
Diffusion Paths ◽  
Oxidation Resistant ◽  
Structural Imperfections ◽  
Short Circuit Diffusion

Oxidation resistant alloys depend on the formation of a continuous layer of protective oxide scale during the oxidation process. The initial stages of oxidation of multi-component alloys can be quite complex, since numerous metal oxides can be formed. For oxidation resistance, the composition is adjusted so that selective oxidation occurs of that element whose oxide affords the most protection. Ideally, the protective oxide scale should be i) structurally perfect, so as to avoid short-circuit diffusion paths, and ii) strongly adherent to the alloy substrate, which minimizes spalling in response to thermal cycling. Small concentrations (∼ 0.1%) of certain reactive elements, such as yttrium, markedly improve the adherence of oxide scales in many alloy systems.

HREM observation of NiO growth on submicron spheres of pure nickel

1989 ◽  
Vol 47 ◽  
pp. 548-549
Author(s):  
C.M. Teng ◽  
T.F. Kelly ◽  
J.P. Zhang ◽  
H.M. Lin ◽  
Y.W. Kim
Keyword(s):  
Nickel Oxide ◽  
Grain Boundaries ◽  
Pure Nickel ◽  
Submicron Particles ◽  
Crystal Formation ◽  
Nickel Wire ◽  
Liquid Droplets ◽  
Oxide Interface ◽  
Nickel Chromium ◽  
Chromium Alloys

Spherical submicron particles of materials produced by electrohydrodynamic (EHD) atomization have been used to study a variety of materials processes including nucleation of alternative crystallization phases in iron-nickel and nickel-chromium alloys, amorphous solidification in submicron droplets of pure metals, and quasi-crystal formation in nickel-chromium alloys. Some experiments on pure nickel, nickel oxide single crystals, the nickel/nickel(II) oxide interface, and grain boundaries in nickel monoxide have been performed by STEM. For these latter studies, HREM is the most direct approach to obtain particle crystal structures at the atomic level. Grain boundaries in nickel oxide have also been investigated by HREM. In this paper, we present preliminary results of HREM observations of NiO growth on submicron spheres of pure nickel.Small particles of pure nickel were prepared by EHD atomization. For the study of pure nickel, 0.5 mm diameter pure nickel wire (99.9975%) is sprayed directly in the EHD process. The liquid droplets solidify in free-flight through a vacuum chamber operated at about 10-7 torr.

AMETEK 820 ALLOY

Alloy Digest ◽  
1999 ◽  
Vol 48 (3) ◽  
Keyword(s):  
Physical Properties ◽  
Production Process ◽  
Tensile Properties ◽  
Powder Metal ◽  
Nickel Chromium ◽  
Chromium Alloys ◽  
Metal Products ◽  
Specialty Metal

Abstract AMETEK 820 alloy is a powder metallurgically produced strip that is used in hardfacing weld wire. The production process, however, can produce other special strip compositions such as the nickel-chromium alloys used as resistance alloys. This datasheet provides information on composition, physical properties, hardness, and tensile properties. It also includes information on powder metal forms. Filing Code: Ni-549. Producer or source: AMETEK Specialty Metal Products.

Enhancement of the performance of CdS/CdTe heterojunction solar cell using TiO2/ZnO bi-layer ARC and V2O5 BSF layers: A simulation approach

2020 ◽  
Vol 92 (2) ◽  
pp. 20901
Author(s):  
Abdul Kuddus ◽  
Md. Ferdous Rahman ◽  
Jaker Hossain ◽  
Abu Bakar Md. Ismail
Keyword(s):  
Solar Cell ◽  
Short Circuit ◽  
Photovoltaic Performance ◽  
Short Circuit Current ◽  
Short Circuit Current Density ◽  
Open Circuit ◽  
Heterojunction Solar Cell ◽  
Back Surface ◽  
Heterojunction Solar Cells

This article presents the role of Bi-layer anti-reflection coating (ARC) of TiO2/ZnO and back surface field (BSF) of V2O5 for improving the photovoltaic performance of Cadmium Sulfide (CdS) and Cadmium Telluride (CdTe) based heterojunction solar cells (HJSCs). The simulation was performed at different concentrations, thickness, defect densities of each active materials and working temperatures to optimize the most excellent structure and working conditions for achieving the highest cell performance using obtained optical and electrical parameters value from the experimental investigation on spin-coated CdS, CdTe, ZnO, TiO2 and V2O5 thin films deposited on the glass substrate. The simulation results reveal that the designed CdS/CdTe based heterojunction cell offers the highest efficiency, η of ∼25% with an enhanced open-circuit voltage, Voc of 0.811 V, short circuit current density, Jsc of 38.51 mA cm−2, fill factor, FF of 80% with bi-layer ARC and BSF. Moreover, it appears that the TiO2/ZnO bi-layer ARC, as well as ETL and V2O5 as BSF, could be highly promising materials of choice for CdS/CdTe based heterojunction solar cell.

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