Influence of carrier cations on the intensity of spectral lines of microelements in atomic-emission spectral analysis

1991 ◽  
Vol 54 (1) ◽  
pp. 10-13
Author(s):  
A. V. Karyakin ◽  
L. P. Shtepa
Keyword(s):  
Spectral Analysis ◽  
Atomic Emission ◽  
Spectral Lines ◽  
Emission Spectral Analysis ◽  
Atomic Emission Spectral Analysis

scholarly journals Spectral interferences and their correction in atomic emission spectral analysis

2019 ◽  
Vol 85 (1II)) ◽  
pp. 15-32
Author(s):  
A. A. Pupyshev
Keyword(s):  
Spectral Analysis ◽  
Microwave Plasma ◽  
Atomic Emission ◽  
Spectral Lines ◽  
Emission Spectral Analysis ◽  
Electric Discharges ◽  
Analytical Line ◽  
Spectral Interferences ◽  
Atomic Emission Spectral Analysis ◽  
Wide Range

The main sources of spectral interferences in atomic emission spectral analysis (AESA) are considered, including both wide-range (bremsstrahlung and recombination continuum, radiation of hot condensed particles and electrode ends, scattered light in the spectrometer, overlapping of the analytical line by the wings of the neighbor strong spectral lines of interfering elements, imposition of the components of molecular bands with the very close lines) and narrow-band (partial or complete overlapping of the analytical line with atomic or ionic lines of the sample elements, electrodes and discharge atmosphere; superposition of spectra from higher orders of reflection in conventional diffraction spectrometers and from neighboring orders in two-dimensional echelle spectrometers). The features of their manifestation in various sources of spectrum excitation (flames, DC arc, spark discharges, arc plasma discharges, inductively coupled plasma, microwave plasma, low-pressure electric discharges, laser spark) are considered. The possibilities of reducing the level of spectral interferences or elimination of the spectral noise at the stage of design and manufacturing of AESA devices, as well as upon selecting and adjusting of operation conditions of the analysis are shown. Much attention is paid to the most easily implemented in practice off-peak correction of wide-range spectral interferences. The modern methods of background correction under the spectral peak (under-peak) using a software for atomic emission spectrometers and providing creation of various mathematical models of the background signal in the vicinity of the analytical line at the stage of developing a specific AESA technique are considered. The issues of the choice of spectral lines for analytical measurements, tables and atlases of spectral lines, electronic databases used for this purpose are considered in detail. Specific features of application of the method of inter-element correction with direct spectral overlapping of the lines are given. The operating sequence for taking into account spectral interferences when developing the analysis techniques is proposed.

scholarly journals Microplasma Anode Meeting Molten Salt Electrochemistry: Charge Transfer and Atomic Emission Spectral Analysis

2018 ◽  
Vol 90 (22) ◽  
pp. 13163-13166
Author(s):  
Guoyu Wei ◽  
Xuegang Liu ◽  
Yuexiang Lu ◽  
Zhe Wang ◽  
Shuang Liu ◽  
...  
Keyword(s):  
Spectral Analysis ◽  
Charge Transfer ◽  
Molten Salt ◽  
Atomic Emission ◽  
Emission Spectral Analysis ◽  
Atomic Emission Spectral Analysis

scholarly journals Methodology of selecting the algorithms for optimization of arc spectral analysis

2019 ◽  
Vol 85 (1II)) ◽  
pp. 77-81
Author(s):  
D. E. Babenkov ◽  
V. I. Otmakhov ◽  
E. V. Petrova ◽  
Yu. A. Povesma ◽  
Yu. E. Salosina
Keyword(s):  
Spectral Analysis ◽  
Elemental Composition ◽  
Atomic Emission ◽  
Emission Spectral Analysis ◽  
Mineral Deposits ◽  
Atomic Emission Spectral Analysis ◽  
Quantitative Spectral Analysis

The goal of the study is the choice of algorithms for optimization of arc atomic emission spectral analysis with MAÉS to elaborate the techniques of quantitative spectral analysis of different objects. The choice of the algorithms is performed on an example of geologic objects with alumosilicate matrix. Determination of the elemental composition of such geological objects is important for obtaining markers, studying geochronological processes, and searching for mineral deposits.

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