Comparison of theory and experiment for two regimes of quantum interference oscillations in the transverse magnetoresistance of pure magnesium

1977 ◽  
Vol 26 (5-6) ◽  
pp. 819-826 ◽  
Author(s):  
R. W. Stark ◽  
R. Reifenberger
ACS Nano ◽  
2020 ◽  
Vol 14 (10) ◽  
pp. 14118-14125
Author(s):  
Hong-Seok Kim ◽  
Tae-Ha Hwang ◽  
Nam-Hee Kim ◽  
Yasen Hou ◽  
Dong Yu ◽  
...  

Entropy ◽  
2020 ◽  
Vol 22 (7) ◽  
pp. 776
Author(s):  
Craig S. Lent

Quantum computation is often limited by environmentally-induced decoherence. We examine the loss of coherence for a two-branch quantum interference device in the presence of multiple witnesses, representing an idealized environment. Interference oscillations are visible in the output as the magnetic flux through the branches is varied. Quantum double-dot witnesses are field-coupled and symmetrically attached to each branch. The global system—device and witnesses—undergoes unitary time evolution with no increase in entropy. Witness states entangle with the device state, but for these blind witnesses, which-path information is not able to be transferred to the quantum state of witnesses—they cannot “see” or make a record of which branch is traversed. The system which-path information leaves no imprint on the environment. Yet, the presence of a multiplicity of witnesses rapidly quenches quantum interference.


2013 ◽  
Vol 111 (5) ◽  
Author(s):  
E. Burzurí ◽  
F. Luis ◽  
O. Montero ◽  
B. Barbara ◽  
R. Ballou ◽  
...  

2020 ◽  
Vol 77 (9) ◽  
pp. 797-801
Author(s):  
Tae-Ha Hwang ◽  
Hong-Seok Kim ◽  
Yasen Hou ◽  
Dong Yu ◽  
Yong-Joo Doh

Author(s):  
Gertrude F. Rempfer

I became involved in electron optics in early 1945, when my husband Robert and I were hired by the Farrand Optical Company. My husband had a mathematics Ph.D.; my degree was in physics. My main responsibilities were connected with the development of an electrostatic electron microscope. Fortunately, my thesis research on thermionic and field emission, in the late 1930s under the direction of Professor Joseph E. Henderson at the University of Washington, provided a foundation for dealing with electron beams, high vacuum, and high voltage.At the Farrand Company my co-workers and I used an electron-optical bench to carry out an extensive series of tests on three-electrode electrostatic lenses, as a function of geometrical and voltage parameters. Our studies enabled us to select optimum designs for the lenses in the electron microscope. We early on discovered that, in general, electron lenses are not “thin” lenses, and that aberrations of focal point and aberrations of focal length are not the same. I found electron optics to be an intriguing blend of theory and experiment. A laboratory version of the electron microscope was built and tested, and a report was given at the December 1947 EMSA meeting. The micrograph in fig. 1 is one of several which were presented at the meeting. This micrograph also appeared on the cover of the January 1949 issue of Journal of Applied Physics. These were exciting times in electron microscopy; it seemed that almost everything that happened was new. Our opportunities to publish were limited to patents because Mr. Farrand envisaged a commercial instrument. Regrettably, a commercial version of our laboratory microscope was not produced.


1978 ◽  
Vol 39 (12) ◽  
pp. 1355-1363 ◽  
Author(s):  
L.G. Caron ◽  
M. Miljak ◽  
D. Jerome

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