Critical current density and microstructure of YBa2Cu3O7 thin films post-annealed at a low oxygen partial pressure

1992 ◽  
Vol 5 (2) ◽  
pp. 143-147 ◽  
Author(s):  
A. Mogro-Campero ◽  
L. G. Turner ◽  
E. L. Hall
2005 ◽  
Vol 105 ◽  
pp. 453-458 ◽  
Author(s):  
J. Wang ◽  
N. Maloufi ◽  
Xiang Xin Xue ◽  
Z.G. Fan ◽  
Claude Esling

High critical current density Jc under high magnetic field is required in numerous applications for high temperature superconductor YBa2Cu3O7-δ (Y123). Significant efforts have been made to control sample preparation in view of optimized textures and microstructures. In YBa2Cu3O7-δ superconductor, Jc is limited by grain misalignment and by other defaults like secondary phase (Y211), microcracks... So YBaCuO films were prepared by electrophoretic deposition directly on polycrystalline Ag substrate. Melt textured growth (MTG) in low oxygen partial pressure and cold rolling were performed to YBaCuO samples respectively to improve texture growth of the films and to study deformation effect on the texture. The film obtained by melted growth after rolling has better texture orientation than the film without rolling, and presents higher critical current density.


1991 ◽  
Vol 251 ◽  
Author(s):  
Yuichi Sawai ◽  
K. Ishizaki ◽  
M. Takata ◽  
A. Kuzjukevics

ABSTRACTGeneraly silver doping into YBa2Cu3O7 superconductor improves the critical temperature and critical current density. In this work the silver peroxide was doped into YBa2Cu4O8 superconductor and sintered by the Oxygen Hot Isostatically Pressing method. The critical temperature of the 124 phase increased by silver peroxide doping.


Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.


2021 ◽  
Vol 22 ◽  
pp. 14-19
Author(s):  
Soon-Gil Jung ◽  
Duong Pham ◽  
Jung Min Lee ◽  
Yoonseok Han ◽  
Won Nam Kang ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
X.K. Wang ◽  
D.X. Li ◽  
S.N. Song ◽  
J.Q. Zheng ◽  
R.P.H. Chang ◽  
...  

AbstractEpitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.


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