Investigation of the local atomic arrangement on surfaces using low-energy ion scattering

1985 ◽  
Vol 38 (3) ◽  
pp. 161-170 ◽  
Author(s):  
E. Taglauer
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Atomic Arrangement ◽  
Local Atomic Arrangement ◽  
Low Energy Ion Scattering

scholarly journals Atomic Arrangement of the Clean Si(110) 5x1 Surface Derived by Low Energy Scattering Spectroscopy

1992 ◽  
Vol 45 (1) ◽  
pp. 85 ◽  
Author(s):  
YG Shen ◽  
DJ O’Connor ◽  
RJ MacDonald
Keyword(s):  
Incident Angle ◽  
Full Range ◽  
Structural Models ◽  
Low Energy ◽  
Scattering Data ◽  
Ion Scattering ◽  
Atomic Arrangement ◽  
Low Energy Ion Scattering ◽  
Reconstructed Surface ◽  
Scan Data

The atomic arrangement of the Si(llO) 5x1 reconstructed surface has been studied by low energy ion scattering. The experimentally measured incident angle scan data were compared with the results of computer simulations for various structural models. Although detailed quantitative interpretation of the full range of ion scattering data is difficult to achieve, there is clear evidence for a major reconstruction of the surface. A reasonable fit for the adatom model between the experimental results and computer simulation suggests that the clean Si(llO) 5x1 surface consists of a mixture of 5x1, 5x4 and 5x5 structures, possibly partially disordered along the [flO] direction. The different adatom and rest atom sites have been determined by fitting the calculation with the experimental data. However, there is no other existing experimental evidence, at this time, to support the adatom or rest atom height.

Sulfidation of W(001) studied by low-energy ion scattering

1994 ◽  
Vol 317 (3) ◽  
pp. 341-352 ◽  
Author(s):  
S.H. Overbury ◽  
R.J.A. van den Oetelaar ◽  
D.R. Mullins
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

Investigation of low-energy ion scattering as a surface analytical technique

1972 ◽  
Vol 30 (1) ◽  
pp. 69-90 ◽  
Author(s):  
D.J. Ball ◽  
T.M. Buck ◽  
D. Macnair ◽  
G.H. Wheatley
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Analytical Technique ◽  
Low Energy Ion Scattering ◽  
Surface Analytical Technique

Low-Energy Ion Scattering Measurements from an Al-Pd-Mn Quasicrystal

2000 ◽  
Vol 643 ◽  
Author(s):  
R. Bastasz ◽  
C. J. Jenks ◽  
T. A. Lograsso ◽  
A. R. Ross ◽  
P. A. Thiel ◽  
...  
Keyword(s):  
Signal Intensity ◽  
Surface Composition ◽  
Incidence Angle ◽  
Local Environment ◽  
Forward Direction ◽  
Low Energy ◽  
Angle Of Incidence ◽  
Fold Axis ◽  
Ion Scattering ◽  
Low Energy Ion Scattering

AbstractEnergy-angle distributions of low-energy inert-gas ions scattered from surfaces provide information about surface composition and structure. We have measured energy spectra of He+ scattered from an Al71Pd20Mn9 quasicrystal, which was oriented perpendicular to the 5-fold axis, along various azimuthal directions. Strong scattering signals are seen from Al and Pd, but only a weak Mn signal is observed. From measurements made of He+ at an oblique angle of incidence scattered in the forward direction, we observe a 72° periodicity in the azimuthal dependence of the scattering signal intensity from Al surface atoms. The effect arises from shadowing effects involving neighboring surface atoms and provides direct evidence that Al surface atoms exist in a local environment with 5-fold symmetry. In addition, measuring the variation of the signal intensity with incidence angle provides information about neighboring atom distances, which compare favorably with a model of the quasicrystal surface derived from the bulk structure.

Combining dynamic and static depth profiling in low energy ion scattering

2013 ◽  
Vol 31 (1) ◽  
pp. 01A113 ◽  
Author(s):  
Rik ter Veen ◽  
Michael Fartmann ◽  
Reinhard Kersting ◽  
Birgit Hagenhoff
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering
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