Verification of CuInSe2 density of states features by reflection electron energy loss spectroscopy

1988 ◽  
Vol 46 (2) ◽  
pp. 137-143 ◽  
Author(s):  
Ch. Kleint ◽  
M. Funke ◽  
R. D. Tomlinson
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Density Of States ◽  
Electron Energy Loss Spectroscopy ◽  
Electron Energy Loss

scholarly journals Momentum-Resolved Electron Energy Loss Spectroscopy for Mapping the Photonic Density of States

ACS Photonics ◽  
2017 ◽  
Vol 4 (4) ◽  
pp. 1009-1014 ◽  
Author(s):  
Prashant Shekhar ◽  
Marek Malac ◽  
Vaibhav Gaind ◽  
Neda Dalili ◽  
Al Meldrum ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Density Of States ◽  
Electron Energy Loss Spectroscopy ◽  
Photonic Density ◽  
Electron Energy Loss

Electron energy-loss spectroscopy characterization of the boronp-like density of states in MgB2

2002 ◽  
Vol 80 (5) ◽  
pp. 778-780 ◽  
Author(s):  
X. Kong ◽  
Y. Q. Wang ◽  
H. Li ◽  
X. F. Duan ◽  
R. C. Yu ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Density Of States ◽  
Electron Energy Loss Spectroscopy ◽  
Electron Energy Loss

Joint Density of States of Wide-Band-Gap Materials by Electron Energy Loss Spectroscopy

1998 ◽  
Vol 12 (13) ◽  
pp. 541-554 ◽  
Author(s):  
X. D. Fan ◽  
J. L. Peng ◽  
L. A. Bursill
Keyword(s):  
Energy Loss ◽  
Band Gap ◽  
Electron Energy ◽  
Dielectric Function ◽  
Density Of States ◽  
Electron Energy Loss Spectroscopy ◽  
Wide Band ◽  
Joint Density ◽  
Wide Band Gap ◽  
Electron Energy Loss

Kramers–Kronig analysis for parallel electron energy loss spectroscopy (PEELS) data is developed as a software package. When used with a JEOL 4000EX high-resolution transmission electron microscope (HRTEM) operating at 100 keV this allows us to obtain the dielectric function of relatively wide band gap materials with an energy resolution of approx. 1.4 eV. The imaginary part of the dielectric function allows the magnitude of the band gap to be determined as well as the joint-density-of-states function. Routines for obtaining three variations of the joint-density of states function, which may be used to predict the optical and dielectric response for angle-resolved or angle-integration scattering geometries are also described. Applications are presented for diamond, aluminum nitride (AlN), quartz ( SiO 2) and sapphire ( Al 2 O 3). The results are compared with values of the band gap and density of states results for these materials obtained with other techniques.

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

Sign in / Sign up

Export Citation Format

Share Document