Three dimensional strain measurements with x-ray energy dispersive spectroscopy

1985 ◽  
Vol 5 (1) ◽  
pp. 21-25 ◽  
Author(s):  
D. R. Black ◽  
C. J. Bechtoldt ◽  
R. C. Placious ◽  
M. Kuriyama
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Three Dimensional ◽  
Energy Dispersive ◽  
Strain Measurements ◽  
X Ray

Elemental hair analysis using nuclear microscopy and X-ray energy dispersive spectroscopy

The Analyst ◽  
1995 ◽  
Vol 120 (3) ◽  
pp. 783 ◽  
Author(s):  
Jill A. Cargnello ◽  
Jonathan J. Powell ◽  
Richard P. H. Thompson ◽  
Peter R. Crocker ◽  
Frank Watt
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Hair Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Nuclear Microscopy

Composition Analysis of Ge/Si1-xGex: C Buffer on Silicon Measured by Planar Scanning Energy Dispersive Spectroscopy

2011 ◽  
Vol 383-390 ◽  
pp. 7619-7623
Author(s):  
Z Z Lu ◽  
F. Yu ◽  
L. Yu ◽  
L. H. Cheng ◽  
P. Han
Keyword(s):  
Energy Dispersive Spectroscopy ◽  
Chemical Vapor ◽  
Energy Dispersive ◽  
Composition Analysis ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
Composition Distribution ◽  
X Ray ◽  
Cvd Method ◽  
Substrate Structure

In this work, Si, Ge element composition distribution in Ge /Si1-xGex:C /Si substrate structure has been characterized and modified by planar scanning energy dispersive spectroscopy (EDS) and X-ray diffraction (XRD). The Ge /Si1-xGex:C /Si substrate samples are grown by chemical vapor deposition (CVD) method. The accuracy of EDS value can be improved by ~ 32%. And the modified EDS results indicate the Ge distribution in the Ge/Si1-xGex:C/Si sub structure.

AN EVALUATION OF THE USE OF ELYTRA AND BODIES IN X-RAY ENERGY-DISPERSIVE SPECTROSCOPIC STUDIES OF THE RED TURNIP BEETLE, ENTOMOSCELIS AMERICANA (COLEOPTERA: CHRYSOMELIDAE)

1980 ◽  
Vol 112 (6) ◽  
pp. 609-614 ◽  
Author(s):  
W. J. Turnock ◽  
G. H. Gerber ◽  
D. U. Sabourin
Keyword(s):  
Discriminant Analysis ◽  
Energy Dispersive Spectroscopy ◽  
Spectroscopic Studies ◽  
Energy Dispersive ◽  
Spectroscopy Technique ◽  
X Ray ◽  
Insect Dispersal ◽  
Canonical Variables ◽  
The Mean ◽  
Individual Variables

AbstractSamples of the bodies and elytra of Entomoscelis americana Brown were analyzed separately by X-ray energy-dispersive spectroscopy. Discriminant analysis revealed that the chemoprints of the bodies of newly-emerged beetles (1 wk old) were distinct from those of post-aestivation beetles (9- to 10-wk old). However, the chemoprints of the elytra of newly-emerged and post-aestivation beetles were not as different as those of the bodies as demonstrated by the overlap in the plot of the first two canonical variables. The variances of the mean difference of individual variables between newly-emerged and post-aestivation groups generally were smaller for elytra than for bodies. This suggests that the chemoprints of the elytra of E. americana are more stable than those of the bodies and consequently the elytra should be more suitable than the bodies in insect dispersal studies utilizing the X-ray energy-dispersive spectroscopy technique.

Interfacial Energy-Dispersive Spectroscopy Profile X-Ray Resolution Measurements in Variable Pressure SEM

2014 ◽  
Vol 20 (5) ◽  
pp. 1565-1575 ◽  
Author(s):  
Abdelhalim Zoukel ◽  
Lahcen Khouchaf ◽  
Jean Di Martino ◽  
David Ruch
Keyword(s):  
Electron Microscope ◽  
Energy Dispersive Spectroscopy ◽  
Shape Change ◽  
High Vacuum ◽  
Energy Dispersive ◽  
Variable Pressure ◽  
Experimental Conditions ◽  
X Ray ◽  
Scanning Electron ◽  
Good Agreement

AbstractA procedure has been developed to follow degradation of energy-dispersive spectroscopy (EDS) X-ray lateral resolution in a variable pressure scanning electron microscope. This procedure is based on evaluation of the EDS profile shape change for different experimental conditions. Some parameters affecting the X-ray resolution in high-vacuum mode have been taken into account. Good agreement between the simulated and experimental EDS profiles shows the reliability of the proposed procedure. A significant improvement in measurement of the EDS profile interfacial distance (DINT) has been achieved.

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