The determination of surface composition profiles in glass by Auger electron spectroscopy and ion etching

R. A. Chappell; C. T. H. Stoddart

doi:10.1007/bf00561972

The determination of surface composition profiles in glass by Auger electron spectroscopy and ion etching

Journal of Materials Science ◽

10.1007/bf00561972 ◽

1977 ◽

Vol 12 (10) ◽

pp. 2001-2010 ◽

Cited By ~ 15

Author(s):

R. A. Chappell ◽

C. T. H. Stoddart

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Ion Etching ◽

Composition Profiles

Download Full-text

On the determination of surface composition in auger electron spectroscopy

Surface Science ◽

10.1016/0039-6028(88)90049-0 ◽

1988 ◽

Vol 202 (3) ◽

pp. 493-508 ◽

Cited By ~ 26

Author(s):

Pavel Lejček

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition

Download Full-text

Determination of the surface composition of palladium-nickel alloy film catalysts using Auger electron spectroscopy

Surface Science ◽

10.1016/0039-6028(75)90127-2 ◽

1975 ◽

Vol 53 (1) ◽

pp. 241-256 ◽

Cited By ~ 42

Author(s):

C.T.H. Stoddart ◽

R.L. Moss ◽

D. Pope

Keyword(s):

Auger Electron Spectroscopy ◽

Nickel Alloy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Alloy Film

Download Full-text

Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2017.04.008 ◽

2017 ◽

Vol 218 ◽

pp. 1-12 ◽

Cited By ~ 10

Author(s):

A. Jablonski ◽

C.J. Powell

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray

Download Full-text

Summary Abstract: Quantitative determination of the surface composition of sulfur‐bearing anion mixtures by Auger electron spectroscopy

Journal of Vacuum Science and Technology ◽

10.1116/1.570437 ◽

1980 ◽

Vol 17 (1) ◽

pp. 214-215 ◽

Cited By ~ 5

Author(s):

N. H. Turner ◽

J. S. Murday ◽

D. E. Ramaker

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition

Download Full-text

Determination of alumina surface composition by Auger electron spectroscopy

Materials Science and Engineering B ◽

10.1016/0921-5107(96)01609-1 ◽

1996 ◽

Vol 40 (1) ◽

pp. 96-99 ◽

Cited By ~ 3

Author(s):

J.-M. Guglielmacci ◽

B. Ealet

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Alumina Surface

Download Full-text

Quantitative determination of surface composition of sulfur bearing anion mixtures by Auger electron spectroscopy

Analytical Chemistry ◽

10.1021/ac50051a021 ◽

1980 ◽

Vol 52 (1) ◽

pp. 84-92 ◽

Cited By ~ 49

Author(s):

N. H. Turner ◽

J. S. Murday ◽

D. E. Ramaker

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition

Download Full-text

Determination of the surface composition of binary alloys by Auger electron spectroscopy: the gold--silver and gold--tin systems

10.2172/7116549 ◽

1976 ◽

Author(s):

S.H. Overbury

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Binary Alloys ◽

Gold Silver

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

Download Full-text

Determination of the depth resolution of Auger electron spectroscopy depth profiles of anodic barrier oxide films on differently pretreated aluminium substrates

Surface and Interface Analysis ◽

10.1002/sia.740220139 ◽

1994 ◽

Vol 22 (1-12) ◽

pp. 175-180 ◽

Cited By ~ 8

Author(s):

J. De Laet ◽

K. De Boeck ◽

H. Terryn ◽

J. Vereecken

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

Depth Resolution ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

Download Full-text

A Multichannel Monitor for Repetitive Auger Electron Spectroscopy with Application to Surface Composition Changes

Review of Scientific Instruments ◽

10.1063/1.1684816 ◽

1970 ◽

Vol 41 (9) ◽

pp. 1349-1354 ◽

Cited By ~ 15

Author(s):

E. N. Sickafus ◽

A. D. Colvin

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

Composition Changes

Download Full-text