Direct measurement by secondary-ion mass spectrometry of self-diffusion of boron in Fe40Ni40B20 glass

1980 ◽  
Vol 15 (3) ◽  
pp. 702-710 ◽  
Author(s):  
R. W. Cahn ◽  
J. E. Evetts ◽  
J. Patterson ◽  
R. E. Somekh ◽  
C. Kenway Jackson
Keyword(s):  
Mass Spectrometry ◽  
Direct Measurement ◽  
Secondary Ion Mass Spectrometry ◽  
Self Diffusion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Probing Diffusion Kinetics with Secondary Ion Mass Spectrometry

MRS Bulletin ◽  
2009 ◽  
Vol 34 (12) ◽  
pp. 907-914 ◽  
Author(s):  
Roger A. De Souza ◽  
Manfred Martin
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Transport Processes ◽  
Fast Diffusion ◽  
Diffusion Kinetics ◽  
Analytical Technique ◽  
Self Diffusion ◽  
Solid State Ionics ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

AbstractSecondary ion mass spectrometry (SIMS) is a powerful analytical technique for determining elemental and isotopic distributions in solids. One of its main attractions to researchers in the field of solid-state ionics is its ability to distinguish between isotopes of the same chemical element as a function of position in a solid. With enriched stable isotopes as diffusion sources, this allows self-diffusion kinetics in solids to be studied. In this article, taking oxygen isotope diffusion in oxides as our main example, we present the standard experimental method, and, subsequently, we discuss several promising developments, in particular the opportunities offered by thin-film geometries, and the investigation of inhomogeneous systems, including possible fast diffusion along grain boundaries and making space-charge layers at interfaces “visible.” These examples demonstrate that SIMS is capable of probing mass transport processes over various length scales, ranging from some nanometers to hundreds of micrometers.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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