Determination of the sulphur content of geological samples by X-ray fluorescent analysis

1980 ◽  
Vol 304 (2-3) ◽  
pp. 125-128 ◽  
Author(s):  
J. Wannemacher ◽  
H. Heilmann
1974 ◽  
Vol 23 (4) ◽  
pp. 333-339
Author(s):  
Hideki TANAKA ◽  
Tomio OZAKI ◽  
Yuzo MORIGUCHI ◽  
Hiroyuki KITAMURA ◽  
Genzo HASHIZUMF
Keyword(s):  
X Ray ◽  

NDT World ◽  
2018 ◽  
pp. 38-41
Author(s):  
Александр Полянский ◽  
Aleksandr Polyansky ◽  
Владислав Полянский ◽  
Vladislav Polyansky

Author(s):  
Daniel D. ◽  
Bello A.

The research aimed at the determination of elemental concentrations of silicon and chromium in five geological samples at the mining site of Garin Awwal area using the method of PIXE for analyses. The choice PIXE method in this research was due to its high sensitivity and multi-element capability that analyzes any element from sodium to uranium in a single spectrum. PIXE technique of 2.5MeV proton beam was used to characterize five samples. Samples were irradiated and analyzed at Centre for Energy Research and Development, Ile-Ife, Osun State, Nigeria. From the Spectra and results generated, silicon and chromium are of commercial deposit in the area, alongside other elements such as Iron(Fe), Magnesium(Mg) and Aluminium(Al) which appear to be deposited in commercial quantities in the area.


1994 ◽  
Vol 51 (2) ◽  
pp. 197-206 ◽  
Author(s):  
S.M. Simabuco ◽  
V.F. Nascimento Filho

Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 were utilized for the excitation of elements while a Si(Li) semiconductor detector coupled to a multichannel emulation card inserted in a microcomputer was used for the detection of the characteristic X-rays. The fundamental parameters method was used for the determination of elemental sensitivities and the irradiator or transmission method for the correction of the absorption effect of characteristic X-rays of elements on the range of atomic number 22 to 42 (Ti to Mo) and excitation with Cd-109. For elements in the range of atomic number 13 to 23 (Al to V) the irradiator method cannot be applied since samples are not transparent for the incident and emergent X-rays. In order to perform the absorption correction for this range of atomic number excited with Fe-55 source, another method was developed based on the experimental value of the absorption coefficients, associated with absorption edges of the elements.


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