Combined electron gas SNMS and SIMS instrument for trace and depth profile analysis with high dynamic range

1987 ◽  
Vol 329 (2-3) ◽  
pp. 116-121 ◽  
Author(s):  
R. Jede ◽  
K. Seifert ◽  
G. Dünnebier
1986 ◽  
Vol 133 (1) ◽  
pp. 26
Author(s):  
J. Mellis ◽  
G.R. Adams ◽  
K.D. Ward

2009 ◽  
Vol 35 (2) ◽  
pp. 113-122 ◽  
Author(s):  
Ke-Hu YANG ◽  
Jing JI ◽  
Jian-Jun GUO ◽  
Wen-Sheng YU

2014 ◽  
Vol 59 (2) ◽  
pp. 57-73 ◽  
Author(s):  
Christopher L. Suiter ◽  
Sivakumar Paramasivam ◽  
Guangjin Hou ◽  
Shangjin Sun ◽  
David Rice ◽  
...  

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