Surface phase analysis by conversion X-ray and conversion electron M�ssbauer spectroscopy

Ulrich Gonser; Peter Schaaf

doi:10.1007/bf00322123

Surface phase analysis by conversion X-ray and conversion electron M�ssbauer spectroscopy

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00322123 ◽

1991 ◽

Vol 341 (1-2) ◽

pp. 131-135 ◽

Cited By ~ 13

Author(s):

Ulrich Gonser ◽

Peter Schaaf

Keyword(s):

Phase Analysis ◽

Conversion Electron ◽

Surface Phase ◽

X Ray ◽

Ssbauer Spectroscopy

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Surface Phase Analysis by Depth-Selective Conversion Electron Mössbauer Spectroscopy

Industrial Applications of the Mössbauer Effect ◽

10.1007/978-1-4613-1827-9_6 ◽

1986 ◽

pp. 121-136 ◽

Cited By ~ 4

Author(s):

K. Saneyoshi ◽

K. Debusmann ◽

W. Keune ◽

R. A. Brand ◽

D. Liljequist

Keyword(s):

Mössbauer Spectroscopy ◽

Phase Analysis ◽

Conversion Electron ◽

Mossbauer Spectroscopy ◽

Surface Phase ◽

Conversion Electron Mössbauer Spectroscopy ◽

Mößbauer Spectroscopy ◽

Selective Conversion ◽

Conversion Electron Mossbauer Spectroscopy

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X-ray phase analysis in leucite systems

Zeitschrift für Kristallographie Supplements ◽

10.1524/zksu.2007.2007.suppl_26.531 ◽

2007 ◽

Vol 2007 (suppl_26) ◽

pp. 531-536 ◽

Cited By ~ 4

Author(s):

J. Maixner ◽

A. Kloužková ◽

M. Mrázová ◽

M. Kohoutková

Keyword(s):

Phase Analysis ◽

X Ray

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EVOLUTIONARY QUANTITATIVE FULL-PROFILE X-RAY PHASE ANALYSIS BASED ON THE RIETVELD METHOD, A SELF-CONFIGURABLE MULTIPOPULATION GENETIC ALGORITHM AND ELEMENTAL ANALYSIS DATA

Industrial laboratory Diagnostics of materials ◽

10.26896/1028-6861-2018-84-3-25-31 ◽

2018 ◽

Vol 84 (3) ◽

pp. 25-31

Author(s):

A. N. Zaloga ◽

P. S. Dubinin ◽

I. S. Yakimov ◽

O. E. Bezrukova ◽

S. V. Burakov ◽

...

Keyword(s):

Genetic Algorithm ◽

Phase Analysis ◽

Elemental Analysis ◽

Rietveld Method ◽

Analysis Data ◽

Elemental Analysis Data ◽

X Ray ◽

Full Profile

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Study of the phase composition of fine-grained tungsten carbide based ceramic materials by x-ray phase analysis

Industrial laboratory Diagnostics of materials ◽

10.26896/1028-6861-2019-85-8-37-42 ◽

2019 ◽

Vol 85 (8) ◽

pp. 37-42 ◽

Cited By ~ 1

Author(s):

P. V. Andreev ◽

K. E. Smetanina ◽

E. A. Lantsev

Keyword(s):

Phase Composition ◽

Tungsten Carbide ◽

Phase Analysis ◽

Ceramic Materials ◽

X Ray ◽

Fine Grained

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The structure of the surface phase: a new normal-incidence X-ray standing wave study

Surface Science ◽

10.1016/s0039-6028(00)00346-0 ◽

2000 ◽

Vol 453 (1-3) ◽

pp. 183-190 ◽

Cited By ~ 21

Author(s):

G.J. Jackson ◽

S.M. Driver ◽

D.P. Woodruff ◽

B.C.C. Cowie ◽

R.G. Jones

Keyword(s):

Standing Wave ◽

Normal Incidence ◽

Surface Phase ◽

New Normal ◽

X Ray

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Quantitative x-ray diffraction phase analysis of coarse airborne particulate collected by cascade impactor sampling

Atmospheric Environment ◽

10.1016/s1352-2310(97)00257-4 ◽

1997 ◽

Vol 31 (23) ◽

pp. 3963-3967 ◽

Cited By ~ 24

Author(s):

V. Esteve ◽

J. Rius ◽

L.E. Ochando ◽

J.M. Amigó

Keyword(s):

Phase Analysis ◽

Cascade Impactor ◽

Airborne Particulate ◽

X Ray Diffraction ◽

X Ray

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Qualitative phase analysis system for crystalline mixtures based on X-ray powder diffraction file

Powder Diffraction ◽

10.1154/1.1757447 ◽

2004 ◽

Vol 19 (4) ◽

pp. 340-346

Author(s):

YuanYuan Qiao ◽

YunFei Xi ◽

DongTao Zhuo ◽

Ji Jun Wang ◽

ShaoFan Lin

Keyword(s):

Phase Analysis ◽

Powder Diffraction ◽

Identification System ◽

Phase Identification ◽

Powder Diffraction File ◽

X Ray ◽

Analysis System ◽

Qualitative Phase ◽

Full Peak

A qualitative phase identification system for crystalline mixtures is presented. The system provides up to five-phase qualitative identification using up to nine-peak filtration, and additive full peak matching based on the powder diffraction file of ICDD. It was implemented using Microsoft Visual C++, and runs under most common Windows systems. Screenshots and examples are included.

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