Determination of diffusion induced concentration profiles in Cr2O3 films on ceramic Al2O3 by Auger sputter depth profiling

1995 ◽  
Vol 353 (5-8) ◽  
pp. 533-535 ◽  
Author(s):  
U. Rothhaar ◽  
H. Oechsner
Keyword(s):  
Depth Profiling ◽  
Concentration Profiles

Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching.

1981 ◽  
Vol 11 ◽  
Author(s):  
Patrick Trocellier ◽  
Bernard Nens ◽  
Charles Engelmann
Keyword(s):  
Charged Particle ◽  
Depth Profiling ◽  
Surface Region ◽  
Rutherford Backscattering ◽  
Heavy Elements ◽  
Chemical Information ◽  
Concentration Profiles ◽  
Near Surface ◽  
Particle Backscattering

The Rutherford backscattering technique is useful for the determination of the concentration profiles of some heavy elements in the near surface region of glasses, but is not able to provide chemical information on the elements detected.

scholarly journals Migration of mineral oil in elastomers

2021 ◽  
Author(s):  
Tobias Förster ◽  
Artur Blivernitz
Keyword(s):  
Diffusion Coefficients ◽  
Mineral Oil ◽  
Activation Energies ◽  
Concentration Profiles ◽  
Small Reservoir ◽  
Experimental Procedure ◽  
Mineral Oils ◽  
The Absolute ◽  
Suitable Measure

AbstractThis work describes a newly introduced experimental procedure to quantify the diffusion progress of mineral oils locally resolved in NBR. Diffusion of reference oils IRM 901, IRM 902 and IRM 903 in NBR with various acrylonitrile contents was investigated. Classical sorption experiments were performed as a basic characterization and compared to the newly introduced method. Here, elastomer specimens are only being dipped with the bottom in a relatively small reservoir of mineral oil. This provides a determination of locally resolved concentration profiles of mineral oils, and the calculation of diffusion coefficients. These diffusion coefficients follow the same trends like those determined via sorption experiments. Despite differences in the absolute numbers, activation energies of diffusion can be applied as a suitable measure for the compatibility of elastomers and fluids.

Quantitative determination of carbon concentration profiles by GD-OES for the study of decarburization in low-carbon steels

2015 ◽  
Vol 48 (2) ◽  
pp. 73-81 ◽  
Author(s):  
Henrique Duarte Alvarenga ◽  
Nele Van Steenberge ◽  
Chris Xhoffer ◽  
Patrick Steegstra ◽  
Jilt Sietsma ◽  
...  
Keyword(s):  
Quantitative Determination ◽  
Carbon Concentration ◽  
Carbon Steels ◽  
Concentration Profiles ◽  
Low Carbon ◽  
Low Carbon Steels

Determination of the Distribution of Ion Implantation Boron in Silicon

2000 ◽  
Vol 650 ◽  
Author(s):  
Te-Sheng Wang ◽  
A.G. Cullis ◽  
E.J.H. Collart ◽  
A.J. Murrell ◽  
M.A. Foad
Keyword(s):  
Electron Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Low Energy ◽  
Concentration Profiles ◽  
Impurity Profile ◽  
Transmission Electron ◽  
Device Applications ◽  
P Type ◽  
Secondary Ion

ABSTRACTBoron is the most important p-type dopant in Si and it is essential that, especially for low energy implantation, both as-implanted B distributions and those produced by annealing should be characterized in very great detail to obtain the required process control for advanced device applications. While secondary ion mass spectrometry (SIMS) is ordinarily employed for this purpose, in the present studies implant concentration profiles have been determined by direct B imaging with approximately nanometer depth and lateral resolution using energy-filtered imaging in the transmission electron microscopy. The as-implanted B impurity profile is correlated with theoretical expectations: differences with respect to the results of SIMS measurements are discussed. Changes in the B distribution and clustering that occur after annealing of the implanted layers are also described.

Determination of Hydrogen Diffusion Coefficients in F82H by Hydrogen Depth Profiling with a Tritium Imaging Plate Technique

2015 ◽  
Vol 67 (2) ◽  
pp. 379-381 ◽  
Author(s):  
M. Higaki ◽  
T. Otsuka ◽  
K. Tokunaga ◽  
K. Hashizume ◽  
K. Ezato ◽  
...  
Keyword(s):  
Diffusion Coefficients ◽  
Hydrogen Diffusion ◽  
Depth Profiling ◽  
Imaging Plate ◽  
Plate Technique

Considerations in Applying Neutron Depth Profiling (NDP) to Li-Ion Battery Research

2022 ◽  
Author(s):  
Daniel J. Lyons ◽  
Jamie L. Weaver ◽  
Anne C. Co
Keyword(s):  
Electrode Materials ◽  
Depth Profiling ◽  
Li Ion Battery ◽  
Neutron Depth Profiling ◽  
Battery Electrode ◽  
Li Ion

Li distribution within micron-scale battery electrode materials is quantified with neutron depth profiling (NDP). This method allows the determination of intra- and inter-electrode parameters such as lithiation efficiency, electrode morphology...

scholarly journals Determination of Diffusion Coefficients Using Thermogravimetric Measurements during High Temperature Oxidation

2012 ◽  
Vol 323-325 ◽  
pp. 289-294
Author(s):  
Patrice Berthod ◽  
Lionel Aranda
Keyword(s):  
Diffusion Coefficient ◽  
High Temperature ◽  
Diffusion Coefficients ◽  
High Temperature Oxidation ◽  
Concentration Profiles ◽  
Metallic Elements ◽  
Chromium Diffusion ◽  
Temperature Oxidation ◽  
Iron Based

Thermogravimetry measurements associated to concentration profiles allow determining a diffusion coefficient at high temperature of the most oxidable one among the metallic elements belonging to the chemical composition of an alloy. In this work the employed method is described and applied to chromia-forming alloys essentially based on nickel but also to selected cobalt-based and iron-based alloys. More precisely DCrvalues were estimated for chromium diffusing through the carbide-free zones developed during high temperature oxidation. The effects of the base element, of the chromium carbides density and of the dendritic orientations on the chromium diffusion were evidenced.

Sign in / Sign up

Export Citation Format

Share Document