Radargrammetric Digital Surface Models Generation from High Resolution Satellite SAR Imagery: Methodology and Case Studies

Author(s):  
Andrea Nascetti ◽  
Paola Capaldo ◽  
Francesca Pieralice ◽  
Martina Porfiri ◽  
Francesca Fratarcangeli ◽  
...  
2020 ◽  
Author(s):  
Sean Salazar ◽  
Helge Smebye ◽  
Regula Frauenfelder ◽  
Frank Miller ◽  
Emil Solbakken ◽  
...  

<p>The availability of consumer remotely piloted aircraft systems (RPAS) has enabled rapidly deployable airborne surveys for civilian applications. Combined with photogrammetric reconstruction techniques, such as Structure-from-Motion (SfM), it has become increasingly feasible to survey large areas with very high resolution, especially when compared with other airborne or spaceborne surveying techniques. A pair of case studies, using an RPAS-based field surveying technique for establishing baseline surface models in steep terrain, are presented for two different natural hazard applications.</p><p>The first case study involved a survey over the entire 1000-m length of a snow-free avalanche path on Sætreskarsfjellet in Stryn municipality in Norway. A terrain-aware, multi-battery flight plan was designed to ensure good photographic coverage over the entire avalanche path and 21 ground control points (GCP) were distributed evenly across the path and subsequently surveyed. More than 400 images were collected over a 0.5 km<sup>2</sup> area, which were processed using a commercial SfM software package. Two digital surface models were reconstructed, each utilizing a different ground control scenario: the first one with the full count of GCP, while the second used only a limited count of GCP, which is more feasible for a repeat survey when avalanche hazard is high. Comparison with data from a pre-existing, airborne LiDAR survey over the avalanche path revealed that the SfM-derived model that utilized only a limited number of GCP diverged significantly from the model that utilized all available GCP. Further differences between the SfM- and LiDAR-derived surface models were observed in areas with very steep slopes and vegetative cover. The same methodology can subsequently be applied during the winter season, after extensive snowfall and/or avalanche events, to deduce relevant avalanche parameters such as snow height, snow distribution and drift, opening of cracks in the snow surface (e.g. for glide avalanches), and avalanche outlines.</p><p>The second case study involved a survey over the entire 1000-m length of a debris flow path at Årnes in Jølster, Norway. The Årnes flow, which caused one fatality, was one of the largest of several tens of debris flows that occurred on July 30, 2019. The flows were triggered by an extreme precipitation event around the Jølstravatnet area. Like with the Sætreskarsfjellet avalanche path case study, a terrain-aware flight plan was established and 24 GCP were distributed and surveyed along the debris flow path. Over 400 images were collected over a 0.3 km<sup>2</sup> area, which were used to reconstruct a high-resolution surface model. Like with the avalanche case study, the SfM-derived model was compared with a pre-existing LiDAR survey-derived digital terrain model. Altitude and volume changes, due to the debris flow event, were calculated using GIS analysis tools.</p><p>The utility of the RPAS survey technique was demonstrated in both case studies, despite difficult accessibility for ground control. It is suggested that a real-time-kinematic (RTK)-enabled workflow may significantly reduce survey time and increase personnel safety by minimizing the number of required GCP.</p><p><strong>Keywords</strong>: Structure-from-Motion, photogrammetry, digital surface model, natural hazards, ground control.</p>


Author(s):  
U. G. Sefercik ◽  
U. Soergel

In recent years, interferometric sytnthetic aperture radar (InSAR) is one of the most preferred techniques to generate digital surface models (DSM) which are the three dimensional (3D) digital cartographic representations of earth surface including all terrain and non-terrain formations. Interferometric DSM generation using synthetic aperture radar (SAR) imagery is not an easy process and the vertical absolute accuracy of the final product depends on various parameters. In this study, we aimed to demonstrate the influence of temporal baseline between SAR image-pairs on the vertical absolute accuracy of high resolution interferometric DSMs. The application was realized covering 20 km<sup>2</sup> area in Berlin, Germany using 15 descending orbit high resolution spotlight (HS) TerraSAR-X (TSX) images. The suitable interferometric pairs were determined for DSM generation and two of them that have similar parameters except temporal baseline were selected regarding the purposes of the study. The master image was selected as same in the generation of both DSMs and the temporal baselines between this master image and slave images were 11 days (1 period) and 187 days (17 periods), respectively. TSX HS DSMs were generated with 2 m grid spacing and the vertical absolute accuracies were calculated based on the comparison with a reference DSM generated by radargrammetry. The analyses were realized for built-up and forest land classes separately. The results proved that longer temporal baseline has negative influence on the vertical absolute accuracies of TSX HS interferometric DSMs. The first DSM which has the shortest temporal baseline, possible for TSX sensing is better than the second one as approx. 1.5 m both for built-up and forest areas.


Author(s):  
Erik Paul ◽  
Holger Herzog ◽  
Sören Jansen ◽  
Christian Hobert ◽  
Eckhard Langer

Abstract This paper presents an effective device-level failure analysis (FA) method which uses a high-resolution low-kV Scanning Electron Microscope (SEM) in combination with an integrated state-of-the-art nanomanipulator to locate and characterize single defects in failing CMOS devices. The presented case studies utilize several FA-techniques in combination with SEM-based nanoprobing for nanometer node technologies and demonstrate how these methods are used to investigate the root cause of IC device failures. The methodology represents a highly-efficient physical failure analysis flow for 28nm and larger technology nodes.


2011 ◽  
Vol 33 (7) ◽  
pp. 1706-1712 ◽  
Author(s):  
Shao-ming Zhang ◽  
Xiang-chen He ◽  
Xiao-hu Zhang ◽  
Yi-wei Sun
Keyword(s):  

2012 ◽  
Vol 117 (C2) ◽  
pp. n/a-n/a ◽  
Author(s):  
Donald R. Thompson ◽  
Jochen Horstmann ◽  
Alexis Mouche ◽  
Nathaniel S. Winstead ◽  
Raymond Sterner ◽  
...  

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