A Novel Test Coverage Metric for Concurrently-Accessed Software Components

In these days most of the software development uses preexisting software components. This approach provides plenty of benefits over the traditional development. Most of the software industries uses their own domain based software libraries where components resides in the form of modules, codes, executable file, documentations, test plans which may be used as it is or with minor changes. Due to shrinking time and high demand of software development it is necessary to use pre tested software components to ensure high functionality in software developed. Software components can be used very easily and without having the worries of errors and bugs because these are developed under expert supervision and well tested. What we have to do is just embed these components in our project. In this paper a survey got conducted over 112 software developer,testers and freelancers. In survey several issues in CBSD were identified. An efficient repository along with a component search engine is developed. All the component retrieval techniques were evaluated and compared with precise and recall method.

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Framework for Semantic Search Enabled Software Component Repository (SSESCR)

International Journal of Scientific Research in Computer Science Engineering and Information Technology ◽

10.32628/cseit183883 ◽

2018 ◽

Author(s):

Vishnu Sharma ◽

Vijay Singh Rathore ◽

Chandikaditya Kumawat

Keyword(s):

Software Quality ◽

Software Reuse ◽

Development Time ◽

Software Component ◽

Semantic Search ◽

Easy Access ◽

Software Components ◽

Efficient Search ◽

Systematic Reuse ◽

New System

Software reuse can improve software quality with the reducing cost and development time. Systematic reuse plan enhances cohesion and reduces coupling for better testability and maintainability. Software reuse approach can be adopted at the highest extent if relevant software components can be easily searched, adapted and integrated into new system. Large software industries hold their own well managed component libraries containing well tested software component with the project category based classification .Access to these repositories are very limited. Software reuse is facing so many problems and still not so popular. This is due to issues of general access, efficient search and adoption of software component. This paper propose a framework which resolves all of the above issues with providing easy access to components, efficient incremental semantics based search, repository management, versioning of components.

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Reliability of Component Based Software with Similar Software Components � a Review

i-manager’s Journal on Software Engineering ◽

10.26634/jse.5.2.1335 ◽

2010 ◽

Vol 5 (2) ◽

pp. 44-49 ◽

Cited By ~ 3

Author(s):

R. Chinnaiyan S ◽

Somasundaram .

Keyword(s):

Software Components

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A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

ISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2019p0419 ◽

2019 ◽

Author(s):

Rommel Estores ◽

Karo Vander Gucht

Keyword(s):

Fault Injection ◽

Fault Simulation ◽

Fault Localization ◽

Pattern Generation ◽

Test Coverage ◽

Actual Case ◽

Electrical Failure ◽

Starting Point ◽

Diagnostic Resolution ◽

Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

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