Practical Second-Order DPA Attacks for Masked Smart Card Implementations of Block Ciphers

In cryptography the block ciphers are the mostly used symmetric algorithms. In the existing system the standard S-Box of Advanced Encryption Standard(AES) is performed using the irreducible polynomial equation in table form known as look-up tables(LUTs). For more security purposes, second-order reversible cellular automata based S-box is created. The security aspects of the S-Box used in the AES algorithm are evaluated using cryptographic properties like Strict Avalanche Criteria, Non-Linearity, Entropy, and Common Immunity Bias. The design of S-Box using second-order reversible Cellular Automata is better concerning security and dynamic aspect as compared to the classical S-boxes used Advanced Encryption Standard.

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On Practical Second-Order Power Analysis Attacks for Block Ciphers

Information and Communications Security - Lecture Notes in Computer Science ◽

10.1007/978-3-642-17650-0_12 ◽

2010 ◽

pp. 155-170 ◽

Cited By ~ 1

Author(s):

Renato Menicocci ◽

Andrea Simonetti ◽

Giuseppe Scotti ◽

Alessandro Trifiletti

Keyword(s):

Power Analysis ◽

Block Ciphers ◽

Second Order ◽

Power Analysis Attacks

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Disappearance Voltage Determinations Using a Convergent Beam

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064979 ◽

1971 ◽

Vol 29 ◽

pp. 184-185

Author(s):

W. L. Bell

Keyword(s):

Second Order ◽

Objective Method ◽

Uniform Thickness ◽

Rocking Curve ◽

Crystal Perfection ◽

Kikuchi Line ◽

Central Maximum ◽

Diffraction Patterns ◽

Convergent Beam ◽

Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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